Measurements of polarization-dependent angle-resolved light scattering from individual microscopic samples using Fourier transform light scattering

被引:12
|
作者
Jung, JaeHwang [1 ,2 ]
Kim, Jinhyung [3 ,4 ]
Seo, Min-Kyo [3 ,4 ]
Park, YongKeun [1 ,2 ,5 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Phys, Daejeon 34141, South Korea
[2] Korea Adv Inst Sci & Technol, KAIST Inst Hlth Sci & Technol, Daejeon 34141, South Korea
[3] Korea Adv Inst Sci & Technol, Dept Phys, Daejeon 305701, South Korea
[4] Korea Adv Inst Sci & Technol, Inst NanoCentury, Daejeon 305701, South Korea
[5] Tomocube Inc, Daejeon 34051, South Korea
来源
OPTICS EXPRESS | 2018年 / 26卷 / 06期
基金
新加坡国家研究基金会;
关键词
DIGITAL HOLOGRAPHIC MICROSCOPY; JONES MATRIX; FLUORESCENCE MICROSCOPY; SENSITIVE MATERIALS; DIFFRACTION PHASE; CELL; SPECTROSCOPY; DISEASE; TOMOGRAPHY; CRYSTALS;
D O I
10.1364/OE.26.007701
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present a method to measure the vector-field light scattering of individual microscopic objects. The polarization-dependent optical field images are measured with quantitative phase imaging at the sample plane, and then numerically propagated to the far-field plane. This approach allows the two-dimensional polarization-dependent angle-resolved light scattered patterns from individual object to be obtained with high precision and sensitivity. Using this method, we present the measurements of the polarization-dependent light scattering of a liquid crystal droplet and individual silver nanowires over scattering angles of 50 degrees. In addition, the spectroscopic extension of the polarization-dependent angle-resolved light scattering is demonstrated using wavelength-scanning illumination. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:7701 / 7711
页数:11
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