Resonant nanostructures for highly confined and ultra-sensitive surface phonon-polaritons

被引:43
作者
Dubrovkin, Alexander M. [1 ]
Qiang, Bo [1 ,2 ]
Salim, Teddy [3 ]
Nam, Donguk [2 ]
Zheludev, Nikolay, I [1 ,4 ,5 ]
Wang, Qi Jie [1 ,2 ]
机构
[1] Nanyang Technol Univ, Ctr Disrupt Photon Technol, SPMS, TPI, Singapore 637371, Singapore
[2] Nanyang Technol Univ, Ctr OptoElect & Biophoton, Sch Elect & Elect Engn, Singapore 639798, Singapore
[3] Nanyang Technol Univ, Sch Mat Sci & Engn, Singapore 639798, Singapore
[4] Univ Southampton, Optoelect Res Ctr, Southampton SO17 1BJ, Hants, England
[5] Univ Southampton, Ctr Photon Metamat, Southampton SO17 1BJ, Hants, England
基金
英国工程与自然科学研究理事会; 新加坡国家研究基金会;
关键词
NEAR-FIELD MICROSCOPY; GERMANIUM; OXIDATION; PLASMONS; EDGE;
D O I
10.1038/s41467-020-15767-y
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Plasmonics on metal-dielectric interfaces was widely seen as the main route for miniaturization of components and interconnect of photonic circuits. However recently, ultra-confined surface phonon-polaritonics in high-index chalcogenide films of nanometric thickness has emerged as an important alternative to plasmonics. Here, using mid-IR near-field imaging we demonstrate tunable surface phonon-polaritons in CMOS-compatible interfaces of few-nm thick germanium on silicon carbide. We show that Ge-SiC resonators with nanoscale footprint can support sheet and edge surface modes excited at the free space wavelength hundred times larger than their physical dimensions. Owing to the surface nature of the modes, the sensitivity of real-space polaritonic patterns provides pathway for local detection of the interface composition change at sub-nanometer level. Such deeply subwavelength resonators are of interest for high-density optoelectronic applications, filters, dispersion control and optical delay devices. Here, the authors demonstrate tunable highly confined surface phonon-polaritons in CMOS-compatible interfaces of nm-thick germanium on silicon carbide. The sensitivity of real-space polaritonic patterns is a pathway for the detection of the interface composition change at sub-nanometer level.
引用
收藏
页数:7
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