Selective Duplication and Selective Comparison for Data Flow Error Detection

被引:0
作者
Thati, Venu Babu [1 ]
Vankeirsbilck, Jens [1 ]
Boydens, Jeroen [1 ]
Pissort, Davy [2 ]
机构
[1] Katholieke Univ Leuven, Dept Comp Sci, M Grp, Bruges Campus, B-8200 Brugge, Belgium
[2] Katholieke Univ Leuven, Dept Elect Engn, M Grp, Bruges Campus, B-8200 Brugge, Belgium
来源
2019 4TH INTERNATIONAL CONFERENCE ON SYSTEM RELIABILITY AND SAFETY (ICSRS 2019) | 2019年
关键词
software reliability; fault tolerance; soft errors; fault detection; SOFT ERRORS;
D O I
10.1109/icsrs48664.2019.8987731
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Embedded systems' hardware can be impacted by soft errors, which can cause data flow errors in the systems' software. In this paper, we present a novel software-based approach to counter data flow errors, called Selective Duplication and Selective Comparison (SDSC). First, we validated our SDSC technique by implementing it for six case studies and submitting it to a fault injection campaign. Next, we measured its execution time overhead. To put the measured results into perspective, we compared them to those of two established techniques, called Critical Block Duplication (CBD) and near Zero silent Data Corruption (nZDC). The results show that our SDSC technique has a higher error detection ratio with a lower silent data corruption compared to both the CBD and nZDC techniques. This does, however, come with a slightly higher execution time overhead.
引用
收藏
页码:10 / 15
页数:6
相关论文
共 22 条
[1]  
ABDI A, 2012, INT REV COMPUT SOFTW, V7, P637
[2]  
Armstrong K, 2018, IEEE INT SYMP ELEC, P193, DOI 10.1109/ISEMC.2018.8393765
[3]   Soft errors in advanced computer systems [J].
Baumann, R .
IEEE DESIGN & TEST OF COMPUTERS, 2005, 22 (03) :258-266
[4]   Radiation-induced soft errors in advanced semiconductor technologies [J].
Baumann, RC .
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2005, 5 (03) :305-316
[5]   Reliability on ARM Processors Against Soft Errors Through SIHFT Techniques [J].
Chielle, Eduardo ;
Rosa, Felipe ;
Rodrigues, Gennaro S. ;
Tambara, Lucas A. ;
Tonfat, Jorge ;
Macchione, Eduardo ;
Aguirre, Fernando ;
Added, Nemitala ;
Medina, Nilberto ;
Aguiar, Vitor ;
Silveira, Marcilei A. G. ;
Ost, Luciano ;
Reis, Ricardo ;
Cuenca-Asensi, Sergio ;
Kastensmidt, Fernanda L. .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2016, 63 (04) :2208-2216
[6]  
Didehban M., 2016, P DAC, P1
[7]   Soft Errors Induced by High-Energy Electrons [J].
Gadlage, Matthew J. ;
Roach, Austin H. ;
Duncan, Adam R. ;
Williams, Aaron M. ;
Bossev, Dobrin P. ;
Kay, Matthew J. .
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2017, 17 (01) :157-162
[8]  
Gonzalez RC, 2012, DIGITAL IMAGE PROCES
[9]   MiBench: A free, commercially representative embedded benchmark suite [J].
Guthaus, MR ;
Ringenberg, JS ;
Ernst, D ;
Austin, TM ;
Mudge, T ;
Brown, RB .
WWC-4: IEEE INTERNATIONAL WORKSHOP ON WORKLOAD CHARACTERIZATION, 2001, :3-14
[10]  
Jagannathan S., 2012, IEEE INT REL PHYS S