Beam Profile Evolution and Beam Quality Changes Inside a Diode-End-Pumped Laser Oscillator

被引：17

作者：

Ye, Zhibin ^{[1
]}

Zhao, Zhigang ^{[1
]}

Pan, Sunqiang ^{[1
]}

Zhang, Xiang ^{[1
]}

Wang, Chunhua ^{[1
]}

Qi, Yunxuan ^{[1
]}

Liu, Chong ^{[1
]}

Xiang, Zhen ^{[1
]}

Ge, Jianhong ^{[1
]}

机构：

[1] Zhejiang Univ, State Key Lab Modern Opt Instrumentat, Hangzhou 310027, Peoples R China

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 2014年 / 50卷 / 02期

关键词：

Beam filling factor; diode-end-pumped; laser beam; laser oscillator; thermal effects; SOLID-STATE LASERS; MASTER-OSCILLATOR; FUNDAMENTAL MODE; POWER-AMPLIFIER; ND-YAG; RESONATORS; OPTIMIZATION; STABILITY; DESIGN; KHZ;

D O I：

10.1109/JQE.2013.2294362

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Experimental observations of beam profile evolution and beam quality changes in an asymmetrical diode-end-pumped laser oscillator are presented. The beam intensity distribution and beam size show great differences between the two intra-cavity counter-propagating beams. Measurements also show that the beam quality changes when the beam passes through the gain medium. These phenomena are attributed to the thermally induced aberrations and soft aperture induced diffractions. The results present a novel clue of designing a high power laser oscillator with fundamental mode output.

引用

页码：62 / 67

页数：6

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