Customized CMOS wavefront sensor

被引：2
作者：
Monteiro, DWDL [1 ]
Vdovin, G [1 ]
Rocha, JG [1 ]
Iordanov, V [1 ]
机构：
[1] Tech Univ Delft, Fac Informat Technol & Syst, Elect Instrumentat Lab 13E, NL-2628 CD Delft, Netherlands
来源：
HIGH-RESOLUTION WAVEFRONT CONTROL: METHODS, DEVICES, AND APPLICATIONS III | 2002年 / 4493卷
关键词：
wavefront sensor; adaptive optics; position-sensitive detector PSD; passive-pixel; CMOS;
D O I：
10.1117/12.454699
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We report on an integrated Hartmann wavefront sensor (WFS) using passive-pixel architecture and pixels clustered as position-sensitive detectors for dynamic wavefront analysis. This approach substitutes a conventional imager, such as a CCD or CMOS imager, by a customized detector, thus improving the overall speed performance. CMOS (complementary-metal-oxide-semiconductor) technology enables on-chip integration of several analog and digital circuitry. The sensor performance depends on the feature size of the technology, noise levels, photosensitive elements employed, architecture chosen and reconstruction algorithm.
引用
收藏
页码：88 / 99
页数：12
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