Application of direct-write electron-beam lithography for deep-submicron fabrication

被引:1
作者
Shy, SL
Yew, JY
Nakamura, K
Chang, CY
机构
来源
16TH ANNUAL SYMPOSIUM ON PHOTOMASK TECHNOLOGY AND MANAGEMENT | 1996年 / 2884卷
关键词
electron beam lithography; helicon wave plasma; electron cyclotron resonance etching; wafer direct write; chemically amplified resist;
D O I
10.1117/12.262816
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Lithography is one of the most important techniques in the IC fabrication and has been extensively used in processing. The high resolution and accuracy of electron beam lithography is most appropriate for making mask of optical and X-ray lithography as well as direct writing on wafer. Two types of resist, ZEP-520 positive resist and SAL-601 negative resist, were prepared for used in the electron beam lithography. Three different patterns, which include isolated line, contact hole and line & space patterns were exposed on the tungsten, oxide, and metal substrates, respectively. The 0.15 mu m resolution of lithography patterns was achieved. For the etching of polysilicon and oxide, well defined profile of polysilicon gate with 0.1 mu m width and well-defined tapered profiles of oxide contact hole have been obtained successfully.
引用
收藏
页码:334 / 343
页数:10
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