Managing subthreshold leakage in charge-based analog circuits with low-VTH transistors by analog T-switch (AT-switch) and super cut-off CMOs (SCCMOS)

被引:50
作者
Ishida, K [1 ]
Kanda, K [1 ]
Tamtrakarn, A [1 ]
Kawaguchi, H [1 ]
Sakurai, T [1 ]
机构
[1] Univ Tokyo, Ctr Collaborat Res, Tokyo 1538505, Japan
关键词
low V-TH; FD-SOI; signia-delta modulator; subthreshold leakage; switched capacitor;
D O I
10.1109/JSSC.2006.870761
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The analog T-switch (AT-switch) scheme is introduced to suppress subthreshold-leakage problems in charge-based analog circuits such as switched capacitors and sample-and-hold circuits. A 0.5-V sigma-delta modulator is manufactured in a 0.15-mu m FD-SOI process with low V-TH of 0.1 V using the concept. The scheme is compared with another leakage-suppression scheme based oil super cut-off CMOS (SCCMOS) and the conventional circuit which are also fabricated. The sigma-delta modulator based on AT-switch greatly improves 8.1-dB SNDR through reducing nonlinear leakage effects while the modulator based on SCCMOS improves the dynamic range rather than the SNDR by comparing with the conventional sigma-delta modulator.
引用
收藏
页码:859 / 867
页数:9
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