Flat Optical and Plasmonic Devices Using Area-Selective Ion-Beam Doping of Silicon

被引:12
|
作者
Salman, Jad [1 ]
Hafermann, Martin [2 ]
Rensberg, Jura [2 ]
Wan, Chenghao [1 ,3 ]
Wambold, Raymond [1 ]
Gundlach, Bradley S. [1 ]
Ronning, Carsten [2 ]
Kats, Mikhail A. [1 ,3 ]
机构
[1] Univ Wisconsin, Dept Elect & Comp Engn, 1415 Engn Dr, Madison, WI 53706 USA
[2] Friedrich Schiller Univ Jena, Inst Solid State Phys, D-07743 Jena, Germany
[3] Univ Wisconsin, Dept Mat Sci & Engn, 1509 Univ Ave, Madison, WI 53706 USA
来源
ADVANCED OPTICAL MATERIALS | 2018年 / 6卷 / 05期
关键词
diffractive optics; ellipsometry; embedded optics; infrared optics; plasmonics; semiconductor materials; NEAR-FIELD; TITANIUM NITRIDE; IMPLANTATION; PHOSPHORUS; EMISSION; SPECTROSCOPY; NANOANTENNAS; ABSORPTION; DIFFUSION; METAL;
D O I
10.1002/adom.201701027
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Highly doped semiconductors are an emerging platform for plasmonic devices. Unlike in noble metals, the carrier concentration of semiconductors can vary by many orders of magnitude, resulting in a widely tunable range of plasma wavelengths spanning the mid-infrared and terahertz ranges. In this work, the potential of highly doped, ion-beam-patterned silicon is demonstrated as a fabrication-friendly platform for flat optical devices. Detailed characterization of the optical properties of silicon is performed at various doping levels, and diffractive optical elements and plasmonic frequency-selective surfaces that operate in the mid-to-far-infrared regime are realized. The resulting optical devices are monolithic, flat, resilient to thermal and physical damage, and can be easily integrated into other silicon-based platforms.
引用
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页数:6
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