Substrate network modeling for CMOS RF circuit simulation

被引:0
作者
Tin, SF [1 ]
Mayaram, K [1 ]
机构
[1] Washington State Univ, Sch Elect Engn & Comp Sci, Pullman, WA 99164 USA
来源
PROCEEDINGS OF THE IEEE 1999 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 1999年
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The effect of the substrate network models for use in small-signal CMOS RF circuit simulation is examined in conjunction with the BSIM3 MOSFET model. Detailed comparisons of the small-signal y and s parameters have been done with both two-dimensional device simulations and measurement data. These comparisons have been made for different bias conditions and channel lengths. It is shown that a simple, one resistance, substrate network model is accurate for small-signal analyses up to a frequency of 10 GHz in a 0.5 mu m CMOS process.
引用
收藏
页码:583 / 586
页数:4
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