Benefits of two-dimensional detectors for synchrotron X-ray diffraction studies of thin film mechanical behavior

被引：17

作者：

Geandier, Guillaume ^{[1
]}

Renault, Pierre-Olivier ^{[1
]}

Teat, Simon ^{[2
]}

Le Bourhis, Eric ^{[1
]}

Lamongie, Bruno ^{[1
]}

Goudeau, Philippe ^{[1
]}

机构：

[1] Univ Poitiers, CNRS, Phys Mat Lab, UMR 6630, F-86962 Futuroscope, France

[2] Adv Light Source, Berkeley, CA 94720 USA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2008年 / 41卷

关键词：

D O I：

10.1107/S0021889808030823

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Performing a complete in situ mechanical property analysis of polycrystalline thin films using X-ray diffraction is time consuming with most standard diffraction beamlines at synchrotron facilities and not realistic with laboratory diffractometers. Two-dimensional detection is shown to enable relatively fast and reliable X-ray strain measurements during in situ tensile testing of gold films deposited on polyimide substrates. Advantages and drawbacks in the use of two-dimensional detectors for this type of analysis are discussed for two commonly used geometries: reflection and transmission. (C) 2008 International Union of Crystallography Printed in Singapore - all rights reserved

引用

页码：1076 / 1088

页数：13

共 50 条

[31] Mechanical properties of nanocrystalline materials [J].

Meyers, MA ;

Mishra, A ;

Benson, DJ .

PROGRESS IN MATERIALS SCIENCE, 2006, 51 (04) :427-556

[32] Experimental measurement of lattice strain pole figures using synchrotron x rays [J].

Miller, MP ;

Bernier, JV ;

Park, JS ;

Kazimirov, A .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (11) :1-11

[33]

NOYAN IC, 1993, MATER RES SOC SYMP P, V308, P3, DOI 10.1557/PROC-308-3

[34] Symmetry properties and transformation behaviour of the X-ray stress factors [J].

Ortner, B .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2006, 39 :401-409

[35] A methodology for measuring in situ lattice strain of bulk polycrystalline material under cyclic load [J].

Park, Jun-Sang ;

Revesz, Peter ;

Kazimirov, Alexander ;

Miller, Matthew P. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (02)

[36] Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data [J].

Renault, PO ;

Le Bourhis, E ;

Villain, P ;

Goudeau, P ;

Badawi, KF ;

Faurie, D .

APPLIED PHYSICS LETTERS, 2003, 83 (03) :473-475

[37] Atomic-scale simulations of the mechanical deformation of nanocrystalline metals [J].

Schiotz, J ;

Vegge, T ;

Di Tolla, FD ;

Jacobsen, KW .

PHYSICAL REVIEW B, 1999, 60 (17) :11971-11983

[38] A comparison of the strength of multilayers, thin films and nanocrystalline compacts [J].

Spaepen, F ;

Yu, DYW .

SCRIPTA MATERIALIA, 2004, 50 (06) :729-732

[39] Local plasticity of Al thin films as revealed by X-ray microdiffraction [J].

Spolenak, R ;

Brown, WL ;

Tamura, N ;

MacDowell, AA ;

Celestre, RS ;

Padmore, HA ;

Valek, B ;

Bravman, JC ;

Marieb, T ;

Fujimoto, H ;

Batterman, BW ;

Patel, JR .

PHYSICAL REVIEW LETTERS, 2003, 90 (09) :4

[40] High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam [J].

Tamura, N ;

Padmore, HA ;

Patel, JR .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2005, 399 (1-2) :92-98

← 1 2 3 4 5 →