Benefits of two-dimensional detectors for synchrotron X-ray diffraction studies of thin film mechanical behavior

被引：17

作者：

Geandier, Guillaume ^{[1
]}

Renault, Pierre-Olivier ^{[1
]}

Teat, Simon ^{[2
]}

Le Bourhis, Eric ^{[1
]}

Lamongie, Bruno ^{[1
]}

Goudeau, Philippe ^{[1
]}

机构：

[1] Univ Poitiers, CNRS, Phys Mat Lab, UMR 6630, F-86962 Futuroscope, France

[2] Adv Light Source, Berkeley, CA 94720 USA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2008年 / 41卷

关键词：

D O I：

10.1107/S0021889808030823

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Performing a complete in situ mechanical property analysis of polycrystalline thin films using X-ray diffraction is time consuming with most standard diffraction beamlines at synchrotron facilities and not realistic with laboratory diffractometers. Two-dimensional detection is shown to enable relatively fast and reliable X-ray strain measurements during in situ tensile testing of gold films deposited on polyimide substrates. Advantages and drawbacks in the use of two-dimensional detectors for this type of analysis are discussed for two commonly used geometries: reflection and transmission. (C) 2008 International Union of Crystallography Printed in Singapore - all rights reserved

引用

页码：1076 / 1088

页数：13

共 50 条

[1]

[Anonymous], 1987, RESIDUAL STRESSES ME

[2] Overview no. 130 - Size effects in materials due to microstructural and dimensional constraints: A comparative review [J].

Arzt, E .

ACTA MATERIALIA, 1998, 46 (16) :5611-5626

[3] Residual strain and texture in free-standing nanoscale Cu-Nb multilayers [J].

Aydiner, C. C. ;

Brown, D. W. ;

Misra, A. ;

Mara, N. A. ;

Wang, Y.-C. ;

Wall, J. J. ;

Almer, J. .

JOURNAL OF APPLIED PHYSICS, 2007, 102 (08)

[4] Tensile testing of ultrathin polycrystalline films:: A synchrotron-based technique [J].

Böhm, J ;

Gruber, P ;

Spolenak, R ;

Stierle, A ;

Wanner, A ;

Arzt, E .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (04) :1110-1119

[5] Elastic properties of polycrystals - influence of texture and stereology [J].

Bunge, HJ ;

Kiewel, R ;

Reinert, T ;

Fritsche, L .

JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 2000, 48 (01) :29-66

[6] Characterization and modelling of the elastic properties of nano-structured W/Cu multilayers [J].

Castelnau, O. ;

Geandier, G. ;

Renault, P. -O. ;

Goudeau, Ph. ;

Le Bourhis, E. .

THIN SOLID FILMS, 2007, 516 (2-4) :320-324

[7] Elastic properties determined from in situ X-ray diffraction [J].

Cervellino, A ;

Derlet, PM ;

Van Swygenhoven, H .

ACTA MATERIALIA, 2006, 54 (07) :1851-1856

[8] Surface tension effect on the mechanical properties of nanomaterials measured by atomic force microscopy -: art. no. 165410 [J].

Cuenot, S ;

Frétigny, C ;

Demoustier-Champagne, S ;

Nysten, B .

PHYSICAL REVIEW B, 2004, 69 (16) :165410-1

[9] Crystal lattice deformation in single poly(p-phenylene benzobisoxazole) fibres [J].

Davies, RJ ;

Eichhorn, SJ ;

Riekel, C ;

Young, RJ .

POLYMER, 2004, 45 (22) :7693-7704

[10] A synchrotron radiation study of transient internal strain changes during the early stages of thermal cycling in an Al/SiCW MMC [J].

Daymond, MR ;

Withers, PJ .

SCRIPTA MATERIALIA, 1996, 35 (10) :1229-1234

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