E9:: The new high-resolution neutron powder diffractometer at the Berlin neutron scattering center

被引：0

作者：

Többens, DM ^{[1
]}

Stüsser, N ^{[1
]}

Knorr, K ^{[1
]}

Mayer, HM ^{[1
]}

Lampert, G ^{[1
]}

机构：

[1] Hahn Meitner Inst Berlin GmbH, D-1000 Berlin, Germany

来源：

EPDIC 7: EUROPEAN POWDER DIFFRACTION, PTS 1 AND 2 | 2001年 / 378-3卷

关键词：

instrument; neutron diffraction; powder diffraction;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A new high-resolution neutron powder diffractometer has been installed at the 10 MW BER II reactor of the Hahn-Meitner-Institut. The instrument is designed for great flexibility in the choice of wavelength and resolution. A typical collection time for one diffraction pattern is 8 h and the best resolution is close to Deltad/d = 2.10(-3). Profile refinements with up to 100 parameters are feasible to determine crystal structures with cell volumes up to 1000 Angstrom (3).

引用

页码：288 / 293

页数：6

共 10 条

[1] AXE JD, 1994, J NEUTRON RES, V2, P85
[2] ESDS AND ESTIMATED PROBABLE-ERROR OBTAINED IN RIETVELD REFINEMENTS WITH LOCAL CORRELATIONS
BERAR, JF
LELANN, P
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1991, 24 : 1 - 5
[3] CHOICE OF COLLIMATORS FOR A CRYSTAL SPECTROMETER FOR NEUTRON DIFFRACTION
CAGLIOTI, G
PAOLETTI, A
RICCI, FP
[J]. NUCLEAR INSTRUMENTS & METHODS, 1958, 3 (04): : 223 - 228
[4] Axial divergence in a conventional X-ray powder diffractometer. II. Realization and evaluation in a fundamental-parameter profile fitting procedure
Cheary, RW
Coelho, AA
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1998, 31 (pt 6) : 862 - 868
[5] A CORRECTION FOR POWDER DIFFRACTION PEAK ASYMMETRY DUE TO AXIAL DIVERGENCE
FINGER, LW
COX, DE
JEPHCOAT, AP
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1994, 27 : 892 - 900
[6] Hewat A. W., 1986, Materials Science Forum, V9, P69, DOI 10.4028/www.scientific.net/MSF.9.69
[7] RIETVELD ANALYSIS OF POWDER PATTERNS OBTAINED BY TOF NEUTRON-DIFFRACTION USING COLD NEUTRON SOURCES
IZUMI, F
ASANO, H
MURATA, H
WATANABE, N
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1987, 20 : 411 - 418
[8] A facility for plastic deformation of germanium single-crystal wafers
Lebech, B
Theodor, K
Breiting, B
Kealey, PG
Hauback, B
Lebech, J
Sorensen, SA
Clausen, KN
[J]. PHYSICA B, 1997, 241 : 204 - 206
[9] RODRIGUEZCARVAJ.J, 1999, UNPUB FULLPROF 99 IL
[10] CRYSTALLOGRAPHIC AND MAGNETIC-STRUCTURES OF HIGH-TC RELATED (BI/PB)2SR2FEO6.25 DETERMINED BY NEUTRON POWDER DIFFRACTION
STUSSER, N
SONNTAG, R
HOHLWEIN, D
ZEISKE, T
HOSER, A
KEMMLERSACK, S
FRIES, T
VOGT, T
[J]. ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1991, 83 (02): : 165 - 170

← 1 →