Above-threshold ionization in a strong dc electric field

被引：7

作者：

Ni, Y. ^{[1
]}

Zamith, S. ^{[1
,2
]}

Lepine, F. ^{[1
]}

Martchenko, T. ^{[1
]}

Kling, M. ^{[1
]}

Ghafur, O. ^{[1
]}

Muller, H. G. ^{[1
]}

Berden, G. ^{[3
]}

Robicheaux, F. ^{[4
]}

Vrakking, M. J. J. ^{[1
]}

机构：

[1] FOM, Inst Atom & Mol Phys, NL-1098 SJ Amsterdam, Netherlands

[2] Univ Toulouse, CNRS, UPS, IRSAMC,Lab Collis,UMR 5589, Toulouse, France

[3] EURATOM, FOM, Inst Plasma Phys, NL-3439 MN Nieuwegein, Netherlands

[4] Auburn Univ, Dept Phys, Auburn, AL 36849 USA

来源：

PHYSICAL REVIEW A | 2008年 / 78卷 / 01期

关键词：

D O I：

10.1103/PhysRevA.78.013413

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

High-lying Rydberg states of Xe have been ionized using intense 108 mu m radiation from a free-electron laser. Measured two-dimensional photoelectron images reveal significant above-threshold ionization and contain an indirect contribution resulting from the combined action of the atomic Coulomb field, laser field, and dc electric field of the spectrometer on the electron. The observation of indirect ionization contains information about the electron localization directly after the laser excitation and indicates that the experiments are performed in the multiphoton regime of strong-field ionization. The experiments are compared to and interpreted by means of both classical and quantum-mechanical simulations.

引用

页数：7

共 13 条

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