The importance of standardizing CDM ESD test head parameters to obtain data correlation

被引：0

作者：

Henry, LG

Kelly, MA

Diep, T

Barth, J

机构：

[1] ESD TLP Consulting, Fremont, CA 94538 USA

[2] Delphi Delco elect Syst, Kokomo, IN 46904 USA

[3] Texas Instruments Inc, Dallas, TX 75266 USA

[4] Barth Elect Inc, Boulder City, NV 89005 USA

来源：

MICROELECTRONICS RELIABILITY | 2001年 / 41卷 / 11期

关键词：

D O I：

10.1016/S0026-2714(01)00035-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Parameters associated with an observed variation in CDM ESD waveforms are shown to be pogo pin diameter, pogo pin length, distance between ground plane (GP) and charge plate, verification module disk diameter, dielectric area, and GP size. The effects on resulting discharge waveforms and solutions for improvement of existing CDM standards will be discussed. (C) 2001 Elsevier Science Ltd. All rights reserved.

引用

页码：1789 / 1800

页数：12