Precision Flexure Stages Design for a Compact Multilayer Laue Lens Test Bed for Hard X-ray Nanofocusing

被引：0

作者：

Shu, D. ^{[1
]}

Chang, G. ^{[2
]}

Zheng, H. ^{[2
]}

Kearney, S. ^{[1
]}

Anton, J. ^{[1
,3
]}

Zhou, A. ^{[2
]}

Shi, H. ^{[2
]}

Conley, R. ^{[1
]}

Macrander, A. ^{[1
]}

Assoufid, L. ^{[1
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source XSD, 9700 S Cass Ave, Argonne, IL 60439 USA

[2] Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100049, Peoples R China

[3] Univ Illinois, Chicago, IL 60607 USA

来源：

13TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI2018) | 2019年 / 2054卷

关键词：

D O I：

10.1063/1.5084645

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Both the Advanced Photon Source (APS) at Argonne National Laboratory (ANL) and the Beijing Synchrotron Radiation Facility (BSRF) at Institute of High Energy Physics (IHEP) have a keen interest in the development of a compact Multilayer Laue Lens (MLL) test bed for hard x-ray nanofocusing. Recently, collaboration between ANL and IHEP, as a part of the Argonne Strategic Partnership Project (SPP) 85J05, has produced designs of precision flexure stages for a compact MLL test bed for hard x-ray nanofocusing using commercial flexural pivots and Argonne developed laminar nanopositioning flexures. Two sets of the new flexure stages will be built with the new designs, one for R&D activities at the BSRF for the new planned 6 GeV high energy photon source (HEPS) and one for upgrade of the existing MLL test bed at the APS x-ray optics test beamline. Mechanical design and preliminary test for the MLL test bed flexure stages for Argonne SPP project 85J05 are presented in this paper.

引用

页数：4

共 7 条

[1] Shu D, 2007, AIP CONF PROC, V879, P1073
[2] Shu D., 2009, US Patent, Patent No. [7,597,475, 7597475]
[3] SHU D, 2003, Patent No. 6607840
[4] Shu D., 2008, P SRI 2008
[5] Shu D., 2011, U.S. Patent granted, Patent No. [7,994,688, 7994688]
[6] Shu D., 2009, P SOC PHOTO-OPT INS, V7424
[7] Optomechanical Design of a Multilayer Laue Lens Test Bed for 10-nm Focusing of Hard X-rays
Shu, Deming
Nazaretski, Evgeny
Kim, Jungdae
Yan, Hanfei
Lauer, Kenneth
Mullany, Brian
Kuhne, Dennis
Maser, Joerg
Chu, Yong S.
[J]. 11TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY (XRM2012), 2013, 463

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