Hardware Trojan Detection by Multiple-Parameter Side-Channel Analysis

被引:179
作者
Narasimhan, Seetharam [1 ]
Du, Dongdong [2 ]
Chakraborty, Rajat Subhra [3 ]
Paul, Somnath [4 ]
Wolff, Francis G. [1 ]
Papachristou, Christos A. [1 ]
Roy, Kaushik [5 ]
Bhunia, Swarup [1 ]
机构
[1] Case Western Reserve Univ, Dept Elect Engn & Comp Sci, Cleveland, OH 44106 USA
[2] Hyland Software, Cleveland, OH 44106 USA
[3] Indian Inst Technol, Dept Comp Sci & Engn, Kharagpur 721302, W Bengal, India
[4] Intel Corp, SoC Design Lab, Hillsboro, OR 97124 USA
[5] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
关键词
Hardware security; hardware Trojan attack; side-channel analysis; logic testing; SENSITIVITY;
D O I
10.1109/TC.2012.200
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Hardware Trojan attack in the form of malicious modification of a design has emerged as a major security threat. Side-channel analysis has been investigated as an alternative to conventional logic testing to detect the presence of hardware Trojans. However, these techniques suffer from decreased sensitivity toward small Trojans, especially because of the large process variations present in modern nanometer technologies. In this paper, we propose a novel noninvasive, multiple-parameter side-channel analysis-based Trojan detection approach. We use the intrinsic relationship between dynamic current and maximum operating frequency of a circuit to isolate the effect of a Trojan circuit from process noise. We propose a vector generation approach and several design/test techniques to improve the detection sensitivity. Simulation results with two large circuits, a 32-bit integer execution unit (IEU) and a 128-bit advanced encryption standard (AES) cipher, show a detection resolution of 1.12 percent amidst +/- 20 percent parameter variations. The approach is also validated with experimental results. Finally, the use of a combined side-channel analysis and logic testing approach is shown to provide high overall detection coverage for hardware Trojan circuits of varying types and sizes.
引用
收藏
页码:2183 / 2195
页数:13
相关论文
共 33 条
[21]  
McIntyre D., 2009, P IEEE INT WORKSH HA
[22]  
Narasimhan S., 2010, P IEEE INT S HARDW O
[23]  
Papoulis A., 2002, Probability, Random Variables and Stochastic Processes
[24]   Low-Overhead Fmax Calibration at Multiple Operating Points Using Delay-Sensitivity-Based Path Selection [J].
Paul, Somnath ;
Mahmoodi, Hamid ;
Bhunia, Swarup .
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2010, 15 (02)
[25]   A measure of quality for n-detection test sets [J].
Pomeranz, I ;
Reddy, SM .
IEEE TRANSACTIONS ON COMPUTERS, 2004, 53 (11) :1497-1503
[26]  
Potkonjak M., 2009, P DES AUT C
[27]   A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental Conditions [J].
Rad, Reza ;
Plusquellic, Jim ;
Tehranipoor, Mohammad .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2010, 18 (12) :1735-1744
[28]   Performance of Delay-Based Trojan Detection Techniques under Parameter Variations [J].
Rai, Devendra ;
Lach, John .
2009 IEEE INTERNATIONAL WORKSHOP ON HARDWARE-ORIENTED SECURITY AND TRUST, 2009, :58-65
[29]   ALPHA-POWER LAW MOSFET MODEL AND ITS APPLICATIONS TO CMOS INVERTER DELAY AND OTHER FORMULAS [J].
SAKURAI, T ;
NEWTON, AR .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (02) :584-594
[30]  
Salmani H., 2010, P IEEE INT WORKSH IN