Tensile and electrical properties of direct aged Cu-Ni-Si-x%Ti alloys

被引:29
作者
Lee, Eungyeong [1 ]
Euh, Kwangjun [2 ]
Han, Seung Zeon [3 ]
Lim, Sunghwan [3 ]
Lee, Jehyun [4 ]
Kim, Sangshik [1 ]
机构
[1] Gyeongsang Natl Univ, Dept Met & Mat Engn, Grad Sch Specialized Aerosp Engn, ReCAPT, Chinju, South Korea
[2] Korea Inst Mat Sci, Dept Mat Proc, Chang Won, South Korea
[3] Kangwon Natl Univ, Dept Adv Mat Sci & Engn, Chunchon, South Korea
[4] Changwon Natl Univ, Dept Mat Sci & Engn, Chang Won, South Korea
基金
新加坡国家研究基金会;
关键词
mechanical properties; electrical conductivity; aging; microstructure; alloys; COLD-WORKING; BEHAVIOR; STRENGTH; MICROSTRUCTURE; PRECIPITATION;
D O I
10.1007/s12540-013-2007-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, the tensile and electrical properties of aged Cu-4Ni-Si-Ti (C4NS-Ti) alloys, with and without solution heat treatment (SHT) prior to aging, were examined. The C4NS specimens, without and with 0.09 and 0.18 wt% of Ti, were prepared and either SHT + aged or DAed (directly aged) at 450 A degrees C for various durations ranging from 0 to 6 h, and the tensile and electrical properties were measured. It was demonstrated that the combined tensile strength/electrical conductivity was substantially greater for the DAed C4NS specimens as compared to the SHT + aged counterparts, and the addition of Ti provided further improvement. The aging responses of DAed C4NS specimens were also strongly affected by added Ti. The effect of SHT on the tensile and electrical properties of aged C4NS alloys and the change in aging behavior with the addition of a small amount of Ti were discussed as a function of aging time based on the micrographic and fractographic analyses.
引用
收藏
页码:183 / 188
页数:6
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