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A high-speed low-power 0.3 mu m CMOS gate array with variable threshold voltage (VT) scheme
被引:19
作者
:
Kuroda, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Kuroda, T
[
1
]
Fujita, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Fujita, T
[
1
]
Nagamatu, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Nagamatu, T
[
1
]
Yoshioka, S
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Yoshioka, S
[
1
]
Sei, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Sei, T
[
1
]
Matsuo, K
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Matsuo, K
[
1
]
Hamura, Y
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Hamura, Y
[
1
]
Mori, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Mori, T
[
1
]
Murota, M
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Murota, M
[
1
]
Kakumu, M
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Kakumu, M
[
1
]
Sakurai, T
论文数:
0
引用数:
0
h-index:
0
机构:
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
Sakurai, T
[
1
]
机构
:
[1]
TOSHIBA CO LTD,SEMICOND DEVICE ENGN LAB,KAWASAKI,KANAGAWA 210,JAPAN
来源
:
PROCEEDINGS OF THE IEEE 1996 CUSTOM INTEGRATED CIRCUITS CONFERENCE
|
1996年
关键词
:
D O I
:
10.1109/CICC.1996.510510
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:53 / 56
页数:4
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