High precision X-ray diffraction studies of polycrystalline materials on synchrotron radiation

被引：2
|
作者：
Shmakov, A. N. [1 ]
机构：
[1] Russian Acad Sci, GK Boreskov Inst Catalysis, Siberian Div, Novosibirsk, Russia
来源：
JOURNAL OF STRUCTURAL CHEMISTRY | 2012年 / 53卷
关键词：
synchrotron radiation; powder diffractometry; anomalous scattering; ANOMALOUS FINE-STRUCTURE; RESOLUTION POWDER DIFFRACTION; CRYSTAL-STRUCTURES; DIAMOND MONOCHROMATOR; CATION DISTRIBUTION; DETECTOR SYSTEM; LIGHT-SOURCE; SCATTERING; BEAMLINE; PEROVSKITE;
D O I：
10.1134/S0022476612070128
中图分类号：
O61 [无机化学];
学科分类号：
070301 ; 081704 ;
摘要：
The review is devoted to application of synchrotron radiation (SR) for studying the structure of polycrystalline materials. The main emphasis is made on the equipment and techniques for acquiring high precision structural information - high angular resolution powder diffractometry and the use of anomalous scattering effect in structural studies. Various schemes of recording the high resolution X-ray patterns are presented, diffractometers operating in the world's leading synchrotron radiation centers are described, and examples of particular applications are reported.
引用
收藏
页码：S133 / S149
页数：17
相关论文
共 50 条
  • [41] HIGH-ENERGY X-RAY DIFFRACTION STUDIES OF BATTERY MATERIALS BY POLYCHROMATIC AND MONOCHROMATIC RADIATION
    Albertini, V. Rossi
    Ronci, F.
    Perfetti, P.
    Reale, P.
    Scrosati, B.
    Panero, S.
    Di Michiel, M.
    Merino, J. M.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C7 - C7
  • [42] Resonant and magnetic X-ray diffraction by polarized synchrotron radiation
    Paolasini, Luigi
    JDN 20 - NEUTRONS ET MAGNETISME, 2014,
  • [43] Analysis of matrix characterization by X-ray diffraction and synchrotron radiation
    Barroso, RC
    Anjos, MJ
    Lopes, RT
    de Jesus, EFO
    Braz, D
    Castro, CRF
    Uhl, A
    RADIATION PHYSICS AND CHEMISTRY, 2002, 65 (4-5) : 501 - 505
  • [44] How X-ray diffraction with synchrotron radiation got started
    Holmes, KC
    Rosenbaum, G
    JOURNAL OF SYNCHROTRON RADIATION, 1998, 5 : 147 - 153
  • [45] Matrix characterization using synchrotron radiation X-ray diffraction
    Barroso, RC
    Anjos, MJ
    Lopes, RT
    de Jesus, EFO
    Simabuco, SM
    Braz, D
    Castro, CRF
    RADIATION PHYSICS AND CHEMISTRY, 2001, 61 (3-6) : 739 - 741
  • [46] DYNAMICAL DIFFRACTION IMAGING (TOPOGRAPHY) WITH X-RAY SYNCHROTRON RADIATION
    KURIYAMA, M
    STEINER, BW
    DOBBYN, RC
    ANNUAL REVIEW OF MATERIALS SCIENCE, 1989, 19 : 183 - 207
  • [47] How X-ray diffraction with synchrotron radiation got started
    Holmes, K.C.
    Rosenbaum, G.
    Journal of Synchrotron Radiation, 1998, 5 (03): : 147 - 153
  • [48] Anomalous Diffraction with Soft X-ray Synchrotron Radiation.
    Carpentier, P.
    Berthet-Colominas, C.
    Capitan, M.
    Chesne, M. -L.
    Fanchon, E.
    Kahn, R.
    Lequien, S.
    Stuhrmann, H.
    Thiaudiere, D.
    Vicat, J.
    Zielinski, P.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2000, 56 : S61 - S61
  • [49] SYNCHROTRON X-RAY POLYCRYSTALLINE DIFFRACTOMETRY
    PARRISH, W
    HART, M
    HUANG, TC
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 : 92 - 100
  • [50] IN-SITU X-RAY DIFFRACTION IMAGING OF POLYCRYSTALLINE MATERIALS
    Wroblewski, T.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1999, 55 : 63 - 63
12345