High precision X-ray diffraction studies of polycrystalline materials on synchrotron radiation

被引：2
|
作者：
Shmakov, A. N. [1 ]
机构：
[1] Russian Acad Sci, GK Boreskov Inst Catalysis, Siberian Div, Novosibirsk, Russia
来源：
JOURNAL OF STRUCTURAL CHEMISTRY | 2012年 / 53卷
关键词：
synchrotron radiation; powder diffractometry; anomalous scattering; ANOMALOUS FINE-STRUCTURE; RESOLUTION POWDER DIFFRACTION; CRYSTAL-STRUCTURES; DIAMOND MONOCHROMATOR; CATION DISTRIBUTION; DETECTOR SYSTEM; LIGHT-SOURCE; SCATTERING; BEAMLINE; PEROVSKITE;
D O I：
10.1134/S0022476612070128
中图分类号：
O61 [无机化学];
学科分类号：
070301 ; 081704 ;
摘要：
The review is devoted to application of synchrotron radiation (SR) for studying the structure of polycrystalline materials. The main emphasis is made on the equipment and techniques for acquiring high precision structural information - high angular resolution powder diffractometry and the use of anomalous scattering effect in structural studies. Various schemes of recording the high resolution X-ray patterns are presented, diffractometers operating in the world's leading synchrotron radiation centers are described, and examples of particular applications are reported.
引用
收藏
页码：S133 / S149
页数：17
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