Tilted fiber Bragg grating sensor interrogation system using a high-resolution silicon-on-insulator arrayed waveguide grating

被引：22

作者：

Cheben, Pavel ^{[1
]}

Post, Edith ^{[1
]}

Janz, Siegfried ^{[1
]}

Albert, Jacques ^{[2
]}

Laronche, Albane ^{[2
]}

Schmid, Lens H. ^{[1
]}

Xu, Dan-Xia ^{[1
]}

Lamontagne, Boris ^{[1
]}

Lapointe, Lean ^{[1
]}

Delage, Andre ^{[1
]}

Densmore, Adam ^{[1
]}

机构：

[1] Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada

[2] Carleton Univ, Dept Elect, Ottawa, ON K1S 5B6, Canada

来源：

OPTICS LETTERS | 2008年 / 33卷 / 22期

关键词：

D O I：

10.1364/OL.33.002647

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We report a compact high-resolution arrayed waveguide grating (AWG) interrogator system designed to measure the relative wavelength spacing between two individual resonances of a tilted fiber Bragg grating (TFBG) refractometer. The TFBG refractometer benefits from an internal wavelength and power reference provided by the core mode reflection resonance that can be used to determine cladding mode perturbations with high accuracy. The AWG interrogator is a planar waveguide device fabricated on a silicon-on-insulator platform, having 50 channels with a 0.18 nm wavelength separation and a footprint of 8 mm X 8 mm. By overlaying two adjacent interference orders of the AWG we demonstrate simultaneous monitoring of two widely separated resonances in real time with high wavelength resolution. The standard deviation of the measured wavelength shifts is 1.2 pm, and it is limited by the resolution of the optical spectrum analyzer used for the interrogator calibration measurements. (C) 2008 Optical Society of America

引用

页码：2647 / 2649

页数：3

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