Microstructural Characterization of Ba0.6Sr0.4TiO3 - MgO Composite Thin Films

被引：0
|
作者：
Ugurlu, O. [1 ]
Feldmann, D. M. [2 ]
Jia, Q. X. [2 ]
Holesinger, T. G. [2 ]
机构：
[1] Univ Minnesota, Characterizat Facil, Shepherd Labs 55, Minneapolis, MN 55404 USA
[2] Los Alamos Natl Lab, Superconduct Technol Ctr, Los Alamos, NM 87545 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
DIELECTRIC-PROPERTIES;
D O I：
10.1017/S1431927609095063
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：1008 / 1009
页数：2
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