Efficiency-limiting defects in silicon solar cell material

被引:20
作者
Bailey, J
McHugo, SA
Hieslmair, H
Weber, ER
机构
[1] Dept. of Mat. Sci. and Mineral Eng., University of California, Berkeley, Berkeley
关键词
defects; silicon efficiency; solar cell;
D O I
10.1007/BF02655376
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The precipitation rate of intentionally introduced iron during low-temperature heating is studied among a variety of single-crystal and polycrystalline silicon solar cell materials. A correlation exists between the iron precipitation rate and the carrier recombination rate in dislocation-free as-grown material, suggesting that diffusion-length-limiting defects in as-grown material are structural defects which accelerate iron precipitation. Phosphorous diffusion gettering was found to be particularly ineffective at improving diffusion length after intentional iron contamination in materials with high iron precipitation rates. We propose that intragranular structural defects in solar cell silicon greatly enhance transition metal precipitation during cooling from the melt and become highly recombination-active when decorated with these impurities. The defects then greatly impair diffusion length improvement during phosphorus gettering and limit carrier lifetimes in as-grown material.
引用
收藏
页码:1417 / 1421
页数:5
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