Spectrally encoded slit confocal microscopy

被引：27

作者：

Kim, Jeongmin ^{[1
]}

Kang, DongKyun ^{[1
]}

Gweon, DaeGab ^{[1
]}

机构：

[1] Korea Adv Inst Sci & Technol, Nano Optomechatron Lab, Dept Mech Engn, Taejon 305701, South Korea

来源：

OPTICS LETTERS | 2006年 / 31卷 / 11期

关键词：

D O I：

10.1364/OL.31.001687

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A simple and cost-effective method for real-time imaging in confocal microscopy is proposed. Spectrally encoded slit confocal microscopy (SESCoM) uses a spectral encoding technique together with a confocal slit aperture to achieve two-dimensional images. Simulation and experimental results of the SESCoM's axial and lateral performances are presented. The measured FWHM of the axial response is 1.15 mu m when an objective with a NA of 0.95 is used. FWHMs of the lateral line spread functions are measured to be 236 and 244 nm along the x and y directions, respectively. Both the axial and the lateral experimental results agree well with the simulation results. (c) 2006 Optical Society of America

引用

页码：1687 / 1689

页数：3

共 8 条

[1]

KIM J, 2005, P SOC PHOTO-OPT INS, V6049, P4906

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