Strong substrate effect in local poling of ultrathin ferroelectric polymer films

被引:44
作者
Chen, XQ
Yamada, H [1 ]
Terai, Y
Horiuchi, T
Matsushige, K
Weiss, PS
机构
[1] Kyoto Univ, Dept Elect Sci & Engn, Venture Business Lab, Kyoto 6068501, Japan
[2] Penn State Univ, Dept Chem, Davey Lab 152, University Pk, PA 16802 USA
基金
美国国家科学基金会;
关键词
atomic force microscopy (AFM); ferroelectric properties; piezoelectric effect; polymers;
D O I
10.1016/S0040-6090(99)00411-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
By locally poling and measuring ultrathin films of the ferroelectric copolymer vinylidenefluoride/trifluoroethylene (VDF/TrFE), we show that the substrates on which these films are adsorbed play a strong role in orienting and poling the films. We carried out both poling and measurements using the Au-coated probe tip of the cantilever of an atomic force microscope. For ultrathin films of about 20 nm of the copolymer spin-coated on graphite, only a fraction of the thickness of the copolymer film can be repoled, so that the net local piezoelectric effect is enhanced or reduced, depending upon whether poling is parallel or antiparallel to that induced by the substrate, respectively. For sufficiently thick films, this substrate effect is negligible. The apparent lateral resolution with which information can be stored by poling in ultrathin films depends strongly on the film thickness and poling direction with respect to the substrate effect. (C) 1999 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:259 / 263
页数:5
相关论文
共 22 条
[1]   Thickness dependence of switching for ferroelectric Langmuir films [J].
Blinov, LM ;
Fridkin, VM ;
Palto, SP ;
Sorokin, AV ;
Yudin, SG .
THIN SOLID FILMS, 1996, 284 :474-476
[2]   Novel switching phenomena in ferroelectric Langmuir-Blodgett films [J].
Bune, A ;
Ducharme, S ;
Fridkin, V ;
Blinov, L ;
Palto, S ;
Petukhova, N ;
Yudin, S .
APPLIED PHYSICS LETTERS, 1995, 67 (26) :3975-3977
[3]   Two-dimensional ferroelectric films [J].
Bune, AV ;
Fridkin, VM ;
Ducharme, S ;
Blinov, LM ;
Palto, SP ;
Sorokin, AV ;
Yudin, SG ;
Zlatkin, A .
NATURE, 1998, 391 (6670) :874-877
[4]   Structures and local polarized domains of ferroelectric organic films studied by atomic force microscopy [J].
Chen, XQ ;
Yamada, H ;
Horiuchi, T ;
Matsushige, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (6B) :3834-3837
[5]   Nondestructive imaging and characterization of ferroelectric domains in periodically poled crystals [J].
Eng, LM ;
Guntherodt, HJ ;
Rosenman, G ;
Skliar, A ;
Oron, M ;
Katz, M ;
Eger, D .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (11) :5973-5977
[6]   MODIFICATION AND DETECTION OF DOMAINS ON FERROELECTRIC PZT FILMS BY SCANNING FORCE MICROSCOPY [J].
FRANKE, K ;
BESOLD, J ;
HAESSLER, W ;
SEEGEBARTH, C .
SURFACE SCIENCE, 1994, 302 (1-2) :L283-L288
[7]   Characterization and control of domain structure in SrBi2Ta2O9 thin films by scanning force microscopy [J].
Gruverman, A ;
Ikeda, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1998, 37 (8A) :L939-L941
[8]   Scanning force microscopy for the study of domain structure in ferroelectric thin films [J].
Gruverman, A ;
Auciello, O ;
Tokumoto, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02) :602-605
[9]   SCANNING FORCE MICROSCOPY AS A TOOL FOR NANOSCALE STUDY OF FERROELECTRIC DOMAINS [J].
Gruverman, Alexei ;
Auciello, Orlando ;
Hatano, Jun ;
Tokumoto, Hiroshi .
FERROELECTRICS, 1996, 184 :11-20
[10]  
Guthner P., 1992, Integrated Ferroelectrics, V1, P379, DOI 10.1080/10584589208215725