共 19 条
Effect of Si-Delta doping and Barrier lengths on the performance of Triple Barrier GaAs/AlGaAs Resonant Tunneling Diode
被引:0
作者:

Singh, Man Mohan
论文数: 0 引用数: 0
h-index: 0
机构:
Aligarh Muslim Univ, Dept Elect Engn, ZHCET, Aligarh 202002, Uttar Pradesh, India Aligarh Muslim Univ, Dept Elect Engn, ZHCET, Aligarh 202002, Uttar Pradesh, India

Siddiqui, M. J.
论文数: 0 引用数: 0
h-index: 0
机构:
Aligarh Muslim Univ, Dept Elect Engn, Aligarh 202002, Uttar Pradesh, India Aligarh Muslim Univ, Dept Elect Engn, ZHCET, Aligarh 202002, Uttar Pradesh, India
机构:
[1] Aligarh Muslim Univ, Dept Elect Engn, ZHCET, Aligarh 202002, Uttar Pradesh, India
[2] Aligarh Muslim Univ, Dept Elect Engn, Aligarh 202002, Uttar Pradesh, India
来源:
2016 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC)
|
2016年
关键词:
Delta-doping;
triple barriers;
resonant tunneling diode;
heterostructure;
III-V Semiconductors;
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
In this article, we analyse the effect of Si-delta doping and barrier legth variation on the performance of triple barrier resonant tunneling diode (TBRTD). Firstly, we propose a model of triple barrier RTD and characterize its properties then insert a delta layer in the middle of the well within geometry of the device. Furthermore, Compare the characteristics of delta-doped structure and normal structure to get the improvization in the device performance. This improvement is used in many applications of memories implementation as well as Negative differential region based applications i.e. Oscillators and rectifiers. Simulation of the device has been performed with the use of Nextnano3 tool which confirms the various results presented in this research.
引用
收藏
页码:30 / 34
页数:5
相关论文
共 19 条
[1]
Thermally activated resonant tunnelling in GaAs/AlGaAs triple barrier heterostructures
[J].
Allford, C. P.
;
Legg, R. E.
;
O'Donnell, R. A.
;
Dawson, P.
;
Missous, M.
;
Buckle, P. D.
.
SEMICONDUCTOR SCIENCE AND TECHNOLOGY,
2015, 30 (10)

Allford, C. P.
论文数: 0 引用数: 0
h-index: 0
机构:
Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales

Legg, R. E.
论文数: 0 引用数: 0
h-index: 0
机构:
Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales

O'Donnell, R. A.
论文数: 0 引用数: 0
h-index: 0
机构:
Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales

论文数: 引用数:
h-index:
机构:

Missous, M.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Manchester, Sch Elect & Elect Engn, Manchester M13 9PL, Lancs, England Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales

Buckle, P. D.
论文数: 0 引用数: 0
h-index: 0
机构:
Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales Cardiff Univ, Sch Phys & Astron, Cardiff CF24 3AA, S Glam, Wales
[2]
Affects of Al concentration on GaN/AlxGa1-xN new modeled multilayer nano-heterostructure
[J].
Alvi, P. A.
;
Gupta, Sapna
;
Vijay, Puja
;
Sharma, G.
;
Siddiqui, M. J.
.
PHYSICA B-CONDENSED MATTER,
2010, 405 (17)
:3624-3629

Alvi, P. A.
论文数: 0 引用数: 0
h-index: 0
机构:
Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India

Gupta, Sapna
论文数: 0 引用数: 0
h-index: 0
机构:
Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India

Vijay, Puja
论文数: 0 引用数: 0
h-index: 0
机构:
Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India

Sharma, G.
论文数: 0 引用数: 0
h-index: 0
机构:
Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India

Siddiqui, M. J.
论文数: 0 引用数: 0
h-index: 0
机构:
Aligarh Muslim Univ, ZH Coll Engn & Technol, Dept Elect Engn, Aligarh 202002, Uttar Pradesh, India Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India
[3]
Modeling and simulation of GaN/Al0.3Ga0.7N new multilayer nano-heterostructure
[J].
Alvi, P. A.
;
Gupta, Sapna
;
Siddiqui, M. J.
;
Sharma, G.
;
Dalela, S.
.
PHYSICA B-CONDENSED MATTER,
2010, 405 (10)
:2431-2435

Alvi, P. A.
论文数: 0 引用数: 0
h-index: 0
机构:
Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India

Gupta, Sapna
论文数: 0 引用数: 0
h-index: 0
机构:
Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India

Siddiqui, M. J.
论文数: 0 引用数: 0
h-index: 0
机构:
Aligarh Muslim Univ, Dept Elect Engn, ZH Coll Engn & Technol, Aligarh 202002, Uttar Pradesh, India Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India

Sharma, G.
论文数: 0 引用数: 0
h-index: 0
机构:
Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India

Dalela, S.
论文数: 0 引用数: 0
h-index: 0
机构:
Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India Banasthali Univ, Dept Phys, Banasthali 304022, Rajasthan, India
[4]
Estimation of interwell terahertz gain by photon-assisted tunneling measurement in triple-barrier resonant tunneling diodes
[J].
Asada, M
;
Oguma, Y
;
Sashinaka, N
.
APPLIED PHYSICS LETTERS,
2000, 77 (05)
:618-620

Asada, M
论文数: 0 引用数: 0
h-index: 0
机构: Tokyo Inst Technol, Interdisciplinary Grad Sch Sci & Engn, Meguro Ku, Tokyo 1528552, Japan

Oguma, Y
论文数: 0 引用数: 0
h-index: 0
机构: Tokyo Inst Technol, Interdisciplinary Grad Sch Sci & Engn, Meguro Ku, Tokyo 1528552, Japan

Sashinaka, N
论文数: 0 引用数: 0
h-index: 0
机构: Tokyo Inst Technol, Interdisciplinary Grad Sch Sci & Engn, Meguro Ku, Tokyo 1528552, Japan
[5]
Temperature-Dependent Analytical Model for Microwave and Noise Performance Characterization of In0.52Al0.48As/InmGa1-mAs (0.53 ≤ m ≤ 0.8) DG-HEMT
[J].
Bhattacharya, Monika
;
Jogi, Jyotika
;
Gupta, R. S.
;
Gupta, Mridula
.
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY,
2013, 13 (01)
:293-300

Bhattacharya, Monika
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Delhi, Dept Elect Sci, Semicond Device Res Lab, New Delhi 110021, India Univ Delhi, Dept Elect Sci, Semicond Device Res Lab, New Delhi 110021, India

论文数: 引用数:
h-index:
机构:

Gupta, R. S.
论文数: 0 引用数: 0
h-index: 0
机构:
Maharaja Agrasen Inst Technol, Dept Elect & Commun Engn, New Delhi 110086, India Univ Delhi, Dept Elect Sci, Semicond Device Res Lab, New Delhi 110021, India

论文数: 引用数:
h-index:
机构:
[6]
nextnano: General purpose 3-D simulations
[J].
Birner, Stefan
;
Zibold, Tobias
;
Andlauer, Till
;
Kubis, Tillmann
;
Sabathil, Matthias
;
Trellakis, Alex
;
Vogl, Peter
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
2007, 54 (09)
:2137-2142

Birner, Stefan
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Munich, Walter Schottky Inst, Theoret Semicond Phys Grp, D-85748 Garching, Germany Tech Univ Munich, Walter Schottky Inst, Theoret Semicond Phys Grp, D-85748 Garching, Germany

Zibold, Tobias
论文数: 0 引用数: 0
h-index: 0
机构: Tech Univ Munich, Walter Schottky Inst, Theoret Semicond Phys Grp, D-85748 Garching, Germany

Andlauer, Till
论文数: 0 引用数: 0
h-index: 0
机构: Tech Univ Munich, Walter Schottky Inst, Theoret Semicond Phys Grp, D-85748 Garching, Germany

Kubis, Tillmann
论文数: 0 引用数: 0
h-index: 0
机构: Tech Univ Munich, Walter Schottky Inst, Theoret Semicond Phys Grp, D-85748 Garching, Germany

Sabathil, Matthias
论文数: 0 引用数: 0
h-index: 0
机构: Tech Univ Munich, Walter Schottky Inst, Theoret Semicond Phys Grp, D-85748 Garching, Germany

Trellakis, Alex
论文数: 0 引用数: 0
h-index: 0
机构: Tech Univ Munich, Walter Schottky Inst, Theoret Semicond Phys Grp, D-85748 Garching, Germany

Vogl, Peter
论文数: 0 引用数: 0
h-index: 0
机构: Tech Univ Munich, Walter Schottky Inst, Theoret Semicond Phys Grp, D-85748 Garching, Germany
[7]
Ballistic quantum transport using the contact block reduction (CBR) method An introduction
[J].
Birner, Stefan
;
Schindler, Christoph
;
Greck, Peter
;
Sabathil, Matthias
;
Vogl, Peter
.
JOURNAL OF COMPUTATIONAL ELECTRONICS,
2009, 8 (3-4)
:267-286

Birner, Stefan
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Munich, Walter Schottky Inst & Phys Dept, D-85478 Garching, Germany Tech Univ Munich, Walter Schottky Inst & Phys Dept, D-85478 Garching, Germany

Schindler, Christoph
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Munich, Walter Schottky Inst & Phys Dept, D-85478 Garching, Germany Tech Univ Munich, Walter Schottky Inst & Phys Dept, D-85478 Garching, Germany

Greck, Peter
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Munich, Walter Schottky Inst & Phys Dept, D-85478 Garching, Germany Tech Univ Munich, Walter Schottky Inst & Phys Dept, D-85478 Garching, Germany

Sabathil, Matthias
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Munich, Walter Schottky Inst & Phys Dept, D-85478 Garching, Germany Tech Univ Munich, Walter Schottky Inst & Phys Dept, D-85478 Garching, Germany

Vogl, Peter
论文数: 0 引用数: 0
h-index: 0
机构:
Tech Univ Munich, Walter Schottky Inst & Phys Dept, D-85478 Garching, Germany Tech Univ Munich, Walter Schottky Inst & Phys Dept, D-85478 Garching, Germany
[8]
4-TERMINAL PHASE-COHERENT CONDUCTANCE
[J].
BUTTIKER, M
.
PHYSICAL REVIEW LETTERS,
1986, 57 (14)
:1761-1764

BUTTIKER, M
论文数: 0 引用数: 0
h-index: 0
[9]
SYMMETRY OF ELECTRICAL-CONDUCTION
[J].
BUTTIKER, M
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1988, 32 (03)
:317-334

BUTTIKER, M
论文数: 0 引用数: 0
h-index: 0
[10]
GROWTH OF III-V SEMICONDUCTORS BY MOLECULAR-BEAM EPITAXY AND THEIR PROPERTIES
[J].
CHO, AY
.
THIN SOLID FILMS,
1983, 100 (04)
:291-317

CHO, AY
论文数: 0 引用数: 0
h-index: 0