Detecting deeper defects using pulse phase thermography

被引：58

作者：

Ishikawa, Masashi ^{[1
]}

Hatta, Hiroshi ^{[1
,2
]}

Habuka, Yoshio ^{[3
]}

Fukui, Ryo ^{[3
]}

Utsunomiya, Shin ^{[4
]}

机构：

[1] Grad Univ Adv Studies Sokendai, Chuo Ku, Sagamihara, Kanagawa 2525210, Japan

[2] Japan Aerosp Explorat Agcy, Chuo Ku, Sagamihara, Kanagawa 2525210, Japan

[3] Krautkramer Japan Co Ltd, Toshima Ku, Tokyo 1710021, Japan

[4] Japan Aerosp Explorat Agcy, Tsukuba, Ibaraki 3058505, Japan

来源：

INFRARED PHYSICS & TECHNOLOGY | 2013年 / 57卷

关键词：

Non-destructive testing; Pulse phase thermography; Finite element method; Noise; LOCK-IN THERMOGRAPHY;

D O I：

10.1016/j.infrared.2012.11.009

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Detectable defect depth by pulse phase thermography (PPT) is reportedly improved when using phase at low frequency. This study was conducted to identify mechanisms detecting deeper defects by the PPT, and to determine the optimum frequencies for detecting defects with various depths and sizes. One-dimensional and finite element analyses reveal that the optimum frequency decreases continuously with increasing defect depth, and that the amplitude of noise appearing in phase data decreases with decreased frequency. These engender a large signal-to-noise ratio for deep defects in a lower-frequency range. The analytical results were verified by experiments for a polymethylmethacrylate specimen having artificial defects. The experimental results at the optimum frequency demonstrated that defects with up to 5-6 mm depth were detected, which is a significant improvement compared with the reported detectable defect depth of 3.5 mm. (C) 2012 Elsevier B.V. All rights reserved.

引用

页码：42 / 49

页数：8

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