A LabVIEW based automatic test system for sieving chips

被引：40

作者：

Wang, Zhongyuan ^{[1
]}

Shang, Yongheng ^{[2
]}

Liu, Jiarui ^{[2
]}

Wu, Xidong ^{[1
]}

机构：

[1] Zhejiang Univ, Sch Informat Sci & Elect Engn, Hangzhou, Zhejiang, Peoples R China

[2] Zhejiang Univ, Sch Aeronaut & Astronaut, Hangzhou, Zhejiang, Peoples R China

来源：

MEASUREMENT | 2013年 / 46卷 / 01期

关键词：

LabVIEW; PXI; DAQ; CMOS chip; DAC testing; Automatic testing system;

D O I：

10.1016/j.measurement.2012.07.015

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The present trend for Complementary Metal Oxide Semiconductor (CMOS) chip designs is smaller in size and power consumption with multifunction. This results the difficulty for the testing engineer, especially for small amount production without an automatic probe station, to complete such task. In order to reduce the workload of the engineer, improve the testing efficiency and accuracy, a LabVIEW based automatic test system for such CMOS chip has been designed in this paper. The details of the overall system which includes the setup of the testing by using a PRI (PCI extensions for instrumentation) system with Data Acquisition (DAQ) and Source Measure Units (SMUs) module, and the LabVIEW based automatic testing program has been introduced in this paper. The testing results have shown that this system is able to improve the testing efficiency with great accuracy, at the same time to evaluate the testing results in real-time. Due to the software is built on different modules, and it is therefore easy to be extended for different applications. (C) 2012 Elsevier Ltd. All rights reserved.

引用

页码：402 / 410

页数：9

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