The temperature dependence of the Debye-Waller factors of B2 NiAl

被引:17
作者
Gumbsch, P
Finnis, MW
机构
[1] Max-Planck-Institut für Metallforschung, Institut für Werksto wissenschaft, Stuttgart, 70174
[2] School of Mathematics and Physics, Queen’s University of Belfast, Belfast, BT7 1NN, Northern Ireland
关键词
D O I
10.1080/095008396180948
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Debye-Waller factors in NiAl have been calculated by a direct real-space numerical simulation using a recently developed interatomic potential of the embedded-atom type. The results show that, at low temperatures, Al atoms have the larger vibration amplitude, but there is a cross-over at about 140 K above which Ni atoms have the larger amplitude. Experimental values of the Debye-Waller factors at 110 K obtained by Nuchter, Weickenmeier and Mayer in 1995 who analysed convergent-beam electron diffraction patterns are in good agreement with the calculations; in particular they show the predicted greater amplitude of Al atoms. Debye-Waller factors obtained by X-ray diffraction at room temperature by Georgopoulos and Cohen in 1977 are in agreement with our prediction of a cross-over between the amplitudes of Ni and Al vibrations.
引用
收藏
页码:137 / 144
页数:8
相关论文
共 8 条
  • [1] Allen M. P., 1987, Computer Simulation of Liquids
  • [2] THE BONDING CHARGE-DENSITY OF BETA'NIAL
    FOX, AG
    TABBERNOR, MA
    [J]. ACTA METALLURGICA ET MATERIALIA, 1991, 39 (04): : 669 - 678
  • [3] DEFECT STRUCTURE AND DEBYE WALLER FACTORS VS COMPOSITION IN BETA-NI1+/-XAL-1+/-X
    GEORGOPOULOS, P
    COHEN, JB
    [J]. SCRIPTA METALLURGICA, 1977, 11 (02): : 147 - 150
  • [4] AN EMPIRICAL INTERATOMIC POTENTIAL FOR B2 NIAL
    LUDWIG, M
    GUMBSCH, P
    [J]. MODELLING AND SIMULATION IN MATERIALS SCIENCE AND ENGINEERING, 1995, 3 (04) : 533 - 542
  • [5] Maradudin AA., 1971, Theory of lattice dynamics in the harmonic approximation
  • [6] BULK AND SURFACE VIBRATIONAL-MODES IN NIAL
    MOSTOLLER, M
    NICKLOW, RM
    ZEHNER, DM
    LUI, SC
    MUNDENAR, JM
    PLUMMER, EW
    [J]. PHYSICAL REVIEW B, 1989, 40 (05) : 2856 - 2872
  • [7] NUCHTER W, 1995, P ELECT MICROSCOPY A, V147, P129
  • [8] Spence J.C.H., 1992, Electron Microdiffraction, DOI [10.1007/978-1-4899-2353-0, DOI 10.1007/978-1-4899-2353-0]