Radiation hardness assurance and reliability testing of InGaAs photodiodes for optical control links for the CMS Experiment

被引：9
|
作者：
Gill, K [1 ]
Axer, M
Dris, S
Grabit, R
Macias, R
Noah, E
Troska, J
Vasey, F
机构：
[1] CERN, PH Dept, CH-1211 Geneva, Switzerland
[2] Univ London Imperial Coll Sci Technol & Med, Dept High Energy Phys, London, England
[3] Univ Autonoma Madrid, Dept Appl Phys, Madrid, Spain
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2005年 / 52卷 / 05期
关键词：
CMS optical links; photodiodes; radiation hardness assurance; reliability;
D O I：
10.1109/TNS.2005.855811
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A radiation hard 80 Mbit/s digital optical link system with 7200 fiber channels is being produced for the CMS Experiment at CERN. A series of tests including radiation damage and thermally accelerated aging have been made to qualify and assure the radiation hardness and reliability of InGaAs photodiodes intended for use in this system.
引用
收藏
页码：1480 / 1487
页数：8
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