Application of power spectral density to specify optical super-smooth surfaces

被引:2
|
作者
Liu, YH [1 ]
Teng, L [1 ]
Li, DQ [1 ]
Zhang, X [1 ]
机构
[1] Flight Automat Control Res Inst, Xian 710065, Peoples R China
关键词
power spectral density; optical super-smooth surface; atomic force microscope; mirror substrate;
D O I
10.1117/12.676477
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The power spectral density (PSD) is an appropriate way to specify the optical super-smooth surfaces. The reasons to characterize the super-smooth surfaces using the PSD are discussed. Some super-smooth mirror substrates obtained by different process methods are measured with an atomic force microscope (AFM). The measured optical surfaces are characterized by the PSD. The result shows that the PSD is of great guidance to the selection of manufacturing methods and process improvement.
引用
收藏
页数:5
相关论文
共 50 条
  • [41] Application of wavelet denoising to power spectral density analysis
    Chen, W
    Yao, HM
    Wu, F
    Wu, SB
    Chen, Q
    2ND INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PTS 1 AND 2, 2006, 6150
  • [42] Characterization of nanoscale roughness in single point diamond turned optical surfaces using power spectral density analysis
    Khan, GS
    Sarepaka, RGV
    Chattopadhyay, KD
    Jain, PK
    Bajpai, RP
    INDIAN JOURNAL OF ENGINEERING AND MATERIALS SCIENCES, 2004, 11 (01) : 25 - 30
  • [43] Correlation between Superhydrophobicity and the Power Spectral Density of Randomly Rough Surfaces
    Awada, Houssein
    Grignard, Bruno
    Jerome, Christine
    Valliant, Alexandre
    De Coninck, Joel
    Nysten, Bernard
    Jonas, Alain M.
    LANGMUIR, 2010, 26 (23) : 17798 - 17803
  • [44] Characterization of ultra-precision machined surfaces with power spectral density
    Yu, Guang
    Li, Peng
    Zhao, Qing-Liang
    Yao, Jun
    Huang, Hai-Tao
    Liu, Xian-Fang
    Zhang, Wei
    Harbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology, 2010, 42 (01): : 29 - 32
  • [45] Power spectral density specification and analysis of system optical jitter
    An Qi-Chang
    Yang Fei
    Guo Peng
    Liu Xiang-Yi
    INTERNATIONAL SYMPOSIUM ON OPTOELECTRONIC TECHNOLOGY AND APPLICATION 2014: IMAGING SPECTROSCOPY; AND TELESCOPES AND LARGE OPTICS, 2014, 9298
  • [46] Measurement of wavefront power spectral density of large optical components
    Xu, Q.
    Gu, Y.Y.
    Chai, L.
    Li, W.
    Guangxue Xuebao/Acta Optica Sinica, 2001, 21 (03): : 344 - 347
  • [47] APPLICATION OF SPATIAL SPECTRAL POWER DENSITY TO CALCULATION OF RESOLUTION LIMITS
    SIRKIS, MD
    BELANGER, F
    IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 1972, AES8 (05) : 687 - &
  • [48] APPLICATION OF GUIDEWAY ROUGHNESS POWER SPECTRAL DENSITY AS A MANAGEMENT TOOL
    CORBIN, JC
    YANG, TL
    MECHANICAL ENGINEERING, 1974, 96 (02) : 70 - 70
  • [49] Laser Frequency Noise Power Spectral Density Measurement Technology and Its Application to Resonant Optical Fiber Gyroscope
    Liu Shuang
    Li Hanzhao
    Liu Lu
    Qian Weiwen
    Lin Yi
    Ma Huilian
    ACTA OPTICA SINICA, 2021, 41 (13)
  • [50] Determination of the Wenzel roughness parameter by the Power Spectral Density of functional Alumina surfaces
    Jardim, P. L. G.
    Horowitz, F.
    Felde, N.
    Schroeder, S.
    Coriand, L.
    Duparre, A.
    THIN SOLID FILMS, 2016, 606 : 57 - 62