Optical percolation and nonlinearity of sputtered Ag island films

被引:30
作者
Ding, S [1 ]
Wang, X
Chen, DJ
Wang, QQ
机构
[1] Wuhan Univ, Dept Phys, Wuhan 430072, Peoples R China
[2] Wuhan Univ, Ctr Nanosci & Nanotechnol Res, Wuhan 430072, Peoples R China
来源
OPTICS EXPRESS | 2006年 / 14卷 / 04期
关键词
D O I
10.1364/OE.14.001541
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The fractal dimension D-f and the critical parameter. of the sputtered percolation Ag island films are measured to be about 1.57 and 1.15, respectively. A modified Z-scan method including both transmittance Z-scan and reflection Z-scan is proposed to measure the pure nonlinear absorption of the semi-continuous Ag films near the percolation threshold. As the microstructure of the sputtered Ag films varies from the discontinuous to the continuous, the linear absorbance decreases from 0.97 to 0.58 while the nonlinear absorption coefficient changes from -1.4 x 10(-5)m/W to -4.6 x 10(-6)m/W at the wavelength of 800nm. The largest nonlinear absorption coefficient beta of the sputtered Ag films is obtained in the discontinuous film near the percolation threshold, which is mainly contributed by the large enhancement of local field of dis-continuous Ag particles. (c) 2006 Optical Society of America.
引用
收藏
页码:1541 / 1546
页数:6
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