The reliability statistic data analysis of automatic testing equipment based on Bayes theory

被引：0
|
作者：
Ma, DW [1 ]
Ye, W [1 ]
Fan, HD [1 ]
机构：
[1] Naval Aeronaut Engn Acad, Dept Armament Engn, Yantai 264001, Peoples R China
来源：
ICEMI 2005: Conference Proceedings of the Seventh International Conference on Electronic Measurement & Instruments, Vol 1 | 2005年
关键词：
Bayes theory; automatic testing equipment reliability; data analysis;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Because the automatic testing equipment is composed of some very precise and costly apparatuses, few test can be done and data can't got very easy in the practical application process. So it is impossible to take out a lot of samples for the test, according to the classical way. In the paper, bayes theory is used in reliability statistic data analysis of automatic testing equipment. The general ways and formulas for point estimation and interval estimation of reliability parameters based on bayes theory are obtained, and these ways and formulas are applied to the reliability statistic data analysis for a certain general automatic testing equipment. The result of example shows that bayes way can gain better estimate value of the reliability eigenvalue by using prior information.
引用
收藏
页码：538 / 542
页数：5
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