Fractal Analysis Correlation of the Images from Scanning Laser Microscopy Techniques and Atomic Force Microscopy

被引:0
|
作者
Toma, Antonela [1 ]
Tranca, Denis E. [1 ]
Sammut, Charles V. [2 ]
Stanciu, George A. [1 ]
机构
[1] Univ Politehn Bucuresti, Ctr Microscopy Microanal & Informat Proc, 313 Splaiul Independentei, Bucharest 060042, Romania
[2] Univ Malta, Fac Sci, Dept Phys, MSD-2080 Msida, Malta
关键词
fractal dimension; optical imaging; multimodal microscopy; laser scanning; PROBE MICROSCOPY;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The laser scanning laser microscopy techniques and atomic force microscopy give complementary information at micro- and nano-scales regarding the surface samples. By using a multimodal microscopy system, having more optical techniques based on far field and near field and an atomic force microscope the same area of the investigated samples. The system is able to acquire the optical images having hundred nanometers or nanometers resolutions and surface topography at nanoscale. Fractal analysis is a very useful tool for quantifying and simulating the complex patterns encountered in microscopic images. The objective of this work is to perform a study of the complex optical and morphological features of certain biological tissues by using fractal geometry. It is shown a correlation between optical images and surface morphology regarding fractal geometry and that fractal dimension is a good candidate to quantify the different images.
引用
收藏
页数:4
相关论文
共 50 条
  • [1] SCANNING TUNNELING MICROSCOPY, ATOMIC FORCE MICROSCOPY, AND RELATED TECHNIQUES
    SNYDER, SR
    WHITE, HS
    ANALYTICAL CHEMISTRY, 1992, 64 (12) : R116 - R134
  • [2] Influence of tip geometry on fractal analysis of atomic force microscopy images
    A. Mannelquist
    N. Almqvist
    S. Fredriksson
    Applied Physics A, 1998, 66 : S891 - S895
  • [3] Influence of tip geometry on fractal analysis of atomic force microscopy images
    Mannelquist, A
    Almqvist, N
    Fredriksson, S
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S891 - S895
  • [4] Novel fractal characteristic of atomic force microscopy images
    Starodubtseva, Maria N.
    Starodubtsev, Ivan E.
    Starodubtsev, Evgenii G.
    MICRON, 2017, 96 : 96 - 102
  • [5] Fractal analysis of scanning probe microscopy images
    Almqvist, N
    SURFACE SCIENCE, 1996, 355 (1-3) : 221 - 228
  • [6] Interpreting scanning tunneling and atomic force microscopy images
    Whangbo, MH
    Ren, J
    Magonov, SN
    Bengel, H
    PHYSICS AND CHEMISTRY OF LOW-DIMENSIONAL INORGANIC CONDUCTORS, 1996, 354 : 241 - 253
  • [7] Quality assessment of atomic force microscopy probes by scanning electron microscopy: Correlation of tip structure with rendered images
    Taatjes, DJ
    Quinn, AS
    Lewis, MR
    Bovill, EG
    MICROSCOPY RESEARCH AND TECHNIQUE, 1999, 44 (05) : 312 - 326
  • [8] Spectral Analysis of Irregular Roughness Artifacts Measured by Atomic Force Microscopy and Laser Scanning Microscopy
    Chen, Yuhang
    Luo, Tingting
    Ma, Chengfu
    Huang, Wenhao
    Gao, Sitian
    MICROSCOPY AND MICROANALYSIS, 2014, 20 (06) : 1682 - 1691
  • [9] Fractal study for describing surface morphology from atomic force microscopy images
    Flueraru, C
    Nastase, S
    Iovan, S
    CAS '97 PROCEEDINGS - 1997 INTERNATIONAL SEMICONDUCTOR CONFERENCE, 20TH EDITION, VOLS 1 AND 2, 1997, : 557 - 560
  • [10] Atomic force microscopy/scanning tunneling microscopy
    Weiss, P.S.
    Journal of the American Chemical Society, 1996, 118 (04):