Quantum jump metrology in a two-cavity network

被引:1
|
作者
Al Rasbi, Kawthar [1 ,2 ]
Beige, Almut [1 ]
Clark, Lewis A. [3 ]
机构
[1] Univ Leeds, Sch Phys & Astron, Leeds LS2 9JT, England
[2] Sultan Qaboos Univ, Dept Phys, Al Khoud 123, Oman
[3] Univ Warsaw, Ctr Quantum Opt Technol, Ctr New Technol, Banacha 2c, PL-02097 Warsaw, Poland
关键词
STATES;
D O I
10.1103/PhysRevA.106.062619
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Quantum metrology enhances measurement precision by utilizing the properties of quantum physics. In inter-ferometry, this is typically achieved by evolving highly entangled quantum states before performing single-shot measurements to reveal information about an unknown parameter. While this is often the optimum approach, implementation with all but the smallest states is still extremely challenging. An alternative approach is quantum jump metrology [L. A. Clark et al., Phys. Rev. A 99, 022102 (2019)], which deduces information by continuously monitoring an open quantum system while inducing phase-dependent temporal correlations with the help of quantum feedback. Taking this approach here, we analyze measurements of a relative phase in an optical network of two cavities with quantum feedback in the form of laser pulses. It is shown that the proposed approach can exceed the standard quantum limit without the need for complex quantum states while being scalable and more practical than previous related schemes.
引用
收藏
页数:12
相关论文
共 50 条
  • [21] Limits of Noisy Quantum Metrology with Restricted Quantum Controls
    Zhou, Sisi
    PHYSICAL REVIEW LETTERS, 2024, 133 (17)
  • [22] Quantum metrology from a quantum information science perspective
    Toth, Geza
    Apellaniz, Iagoba
    JOURNAL OF PHYSICS A-MATHEMATICAL AND THEORETICAL, 2014, 47 (42)
  • [23] Improved Quantum Metrology Using Quantum Error Correction
    Duer, W.
    Skotiniotis, M.
    Froewis, F.
    Kraus, B.
    PHYSICAL REVIEW LETTERS, 2014, 112 (08)
  • [24] Power of one bit of quantum information in quantum metrology
    Cable, Hugo
    Gu, Mile
    Modi, Kavan
    PHYSICAL REVIEW A, 2016, 93 (04)
  • [25] Quantum metrology in coarsened measurement reference
    Xie, Dong
    Xu, Chunling
    Wang, An Min
    PHYSICAL REVIEW A, 2017, 95 (01)
  • [26] Quantum Metrology of Noisy Spreading Channels
    Gorecki, Wojciech
    Riccardi, Alberto
    Maccone, Lorenzo
    PHYSICAL REVIEW LETTERS, 2022, 129 (24)
  • [27] True precision limits in quantum metrology
    Jarzyna, Marcin
    Demkowicz-Dobrzanski, Rafal
    NEW JOURNAL OF PHYSICS, 2015, 17
  • [28] Optimal metrology with programmable quantum sensors
    Marciniak, Christian D.
    Feldker, Thomas
    Pogorelov, Ivan
    Kaubruegger, Raphael
    Vasilyev, Denis V.
    van Bijnen, Rick
    Schindler, Philipp
    Zoller, Peter
    Blatt, Rainer
    Monz, Thomas
    NATURE, 2022, 603 (7902) : 604 - +
  • [29] Multiparameter quantum metrology with postselection measurements
    Ho, Le Bin
    Kondo, Yasushi
    JOURNAL OF MATHEMATICAL PHYSICS, 2021, 62 (01)
  • [30] Sensitivity Bounds for Multiparameter Quantum Metrology
    Gessner, Manuel
    Pezze, Luca
    Smerzi, Augusto
    PHYSICAL REVIEW LETTERS, 2018, 121 (13)