Quantification of the loss mechanisms in emerging water splitting photoanodes through empirical extraction of the spatial charge collection efficiency
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作者:
Segev, Gideon
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Lawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Lawrence Berkeley Natl Lab, Joint Ctr Artificial Photosynth, Berkeley, CA 94720 USALawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Segev, Gideon
[1
,2
]
Jiang, Chang-Ming
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Lawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Lawrence Berkeley Natl Lab, Joint Ctr Artificial Photosynth, Berkeley, CA 94720 USALawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Jiang, Chang-Ming
[1
,2
]
Cooper, Jason K.
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Lawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Lawrence Berkeley Natl Lab, Joint Ctr Artificial Photosynth, Berkeley, CA 94720 USALawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Cooper, Jason K.
[1
,2
]
Eichhorn, Johanna
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Lawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Lawrence Berkeley Natl Lab, Joint Ctr Artificial Photosynth, Berkeley, CA 94720 USALawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Eichhorn, Johanna
[1
,2
]
Toma, Francesca M.
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Lawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Lawrence Berkeley Natl Lab, Joint Ctr Artificial Photosynth, Berkeley, CA 94720 USALawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Toma, Francesca M.
[1
,2
]
Sharp, Ian D.
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机构:
Lawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Lawrence Berkeley Natl Lab, Joint Ctr Artificial Photosynth, Berkeley, CA 94720 USA
Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany
Tech Univ Munich, Phys Dept, D-85748 Garching, GermanyLawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
Sharp, Ian D.
[1
,2
,3
,4
]
机构:
[1] Lawrence Berkeley Natl Lab, Chem Sci Div, Berkeley, CA 94720 USA
[2] Lawrence Berkeley Natl Lab, Joint Ctr Artificial Photosynth, Berkeley, CA 94720 USA
[3] Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany
The operando quantification of surface and bulk losses is key to developing strategies for optimizing photoelectrodes and realizing high efficiency photoelectrochemical solar energy conversion systems. This is particularly true for emerging thin film semiconductors, in which photocarrier diffusion lengths, surface and bulk recombination processes, and charge separation and extraction limitations are poorly understood. Insights into mechanisms of efficiency loss can guide strategies for nanostructuring photoelectrodes, engineering interfaces, and incorporating catalysts. However, few experimental methods are available for direct characterization of dominant loss processes under photoelectrochemical operating conditions. In this work, we provide insight into the function and limitations of an emerging semiconductor photoanode, gamma-Cu3V2O8, by quantifying the spatial collection efficiency (SCE), which is defined as the fraction of photogenerated charge carriers at each point below the surface that contributes to the measured current. Analyzing SCE profiles at different operating potentials shows that increasing the applied potential primarily acts to reduce surface recombination rather than to increase the thickness of the space charge region under the semiconductor/electrolyte interface. Comparing SCE profiles obtained with and without a sacrificial reagent allows surface losses from electronically active defect states to be distinguished from performance bottlenecks arising from slow reaction kinetics. Combining these insights promotes a complete understanding of the photoanode performance and its potential as a water splitting photoanode. More generally, application of the SCE extraction method can aid in the discovery and evaluation of new materials for solar water splitting devices by providing mechanistic details underlying photocurrent generation and loss.
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Connelly, Blair C.
;
Metcalfe, Grace D.
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USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Metcalfe, Grace D.
;
Shen, Hongen
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USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Shen, Hongen
;
Wraback, Michael
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USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Connelly, Blair C.
;
Metcalfe, Grace D.
论文数: 0引用数: 0
h-index: 0
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Metcalfe, Grace D.
;
Shen, Hongen
论文数: 0引用数: 0
h-index: 0
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA
Shen, Hongen
;
Wraback, Michael
论文数: 0引用数: 0
h-index: 0
机构:
USA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USAUSA, Res Lab, Sensors & Elect Devices Directorate, RDRL SEE M, Adelphi, MD 20783 USA