Technology and parameters of thin membrane-anode for MEMS transmission electron microscope

被引:13
作者
Krysztof, Michal [1 ]
Grzebyk, Tomasz [1 ]
Szyszka, Piotr [1 ]
Laszczyk, Karolina [1 ]
Drzazga, Anna Gorecka [1 ]
Dziuban, Jan [1 ]
机构
[1] Wroclaw Univ Technol, Fac Microsyst Elect & Photon, Janiszewskiego Str 11-17, PL-50372 Wroclaw, Poland
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2018年 / 36卷 / 02期
关键词
BEAM MICROCOLUMN;
D O I
10.1116/1.5006151
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A concept of a miniaturized microelectromechanical system based transmission electron microscope is presented. This device consists of two parts: part 1-electron optics column with a high vacuum micropump and part 2-sample chamber with a detector. These two parts are separated with a common electrode, called the anode. The anode consists of a very thin membrane (membrane-anode) that encloses the electron optics microsystem. It is used to let the electron beam pass to the sample and it must endure the pressure difference between its both parts. In this paper, the authors describe the fabrication process of the membrane-anode. It is made of Si3N4 layer deposited on an oxidized silicon substrate and is fabricated in five steps: photolithography, plasma etching, wet anisotropic etching, oxide stripping, and removing the Si3N4 and SiO2 layers. The membranes were characterized, and their preliminary performance parameters are presented, i.e., the endurance and the electron transmission. Published by the AVS.
引用
收藏
页数:6
相关论文
共 26 条
[1]  
Cho W, 2007, TRANSDUCERS '07 & EUROSENSORS XXI, DIGEST OF TECHNICAL PAPERS, VOLS 1 AND 2
[2]   A MEMS Reactor for Atomic-Scale Microscopy of Nanomaterials Under Industrially Relevant Conditions [J].
Creemer, J. Fredrik ;
Helveg, Stig ;
Kooyman, Patricia J. ;
Molenbroek, Alfons M. ;
Zandbergen, Henny W. ;
Sarro, Pasqualina M. .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2010, 19 (02) :254-264
[3]   Electron microscopy of whole cells in liquid with nanometer resolution [J].
de Jonge, N. ;
Peckys, D. B. ;
Kremers, G. J. ;
Piston, D. W. .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2009, 106 (07) :2159-2164
[4]  
de Jonge N, 2011, NAT NANOTECHNOL, V6, P695, DOI [10.1038/NNANO.2011.161, 10.1038/nnano.2011.161]
[5]   Electron-beam microcolumn fabrication and testing [J].
Despont, M ;
Staufer, U ;
Stebler, C ;
Gross, H ;
Vettiger, P .
MICROELECTRONIC ENGINEERING, 1996, 30 (1-4) :69-72
[6]   Optimization of a low-stress silicon nitride process for surface-micromachining applications [J].
French, PJ ;
Sarro, PM ;
Mallee, R ;
Fakkeldij, EJM ;
Wolffenbuttel, RF .
SENSORS AND ACTUATORS A-PHYSICAL, 1997, 58 (02) :149-157
[7]  
Grogan Joseph M., 2012, Journal of the Indian Institute of Science, V92, P295
[8]   In situ liquid-cell electron microscopy of colloid aggregation and growth dynamics [J].
Grogan, Joseph M. ;
Rotkina, Lolita ;
Bau, Haim H. .
PHYSICAL REVIEW E, 2011, 83 (06)
[9]   Glow-discharge ion-sorption micropump for vacuum MEMS [J].
Grzebyk, T. ;
Gorecka-Drzazga, A. ;
Dziuban, J. A. .
SENSORS AND ACTUATORS A-PHYSICAL, 2014, 208 :113-119
[10]   Lateral MEMS-Type Field Emission Electron Source [J].
Grzebyk, Tomasz ;
Szyszka, Piotr ;
Gorecka-Drzazga, Anna ;
Dziuban, Jan A. .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (02) :809-813