Wavelength detector using a pair of metal-semiconductor-metal photodetectors with subwavelength finger spacings

被引：5
作者：
Chen, E
Chou, SY
机构：
[1] Univ of Minnesota, Minneapolis
来源：
ELECTRONICS LETTERS | 1996年 / 32卷 / 16期
关键词：
metal-semiconductor-metal structures; photodetectors;
D O I：
10.1049/el:19960964
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A wavelength detector that employs two metal-semiconductor-metal photodetectors with different subwavelength finger spacings is proposed and demonstrated. The resonance effect of the subwavelength-spaced fingers results in a photocurrent ratio that has one-to-one correspondence with the wavelengths of the monochromatic incident light. The device has a spectral range of 450 - 800nm with a resolution of 5nm. This device makes automatic wavelength calibration in optical instrumentation feasible.
引用
收藏
页码：1510 / 1511
页数：2
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