Fault Detection Techniques for Analog/Mixed Signal SoC design

被引：0

作者：

Deshmukh, Alpana A. ^{[1
]}

Gamad, Radhe Shyam ^{[2
]}

Mishra, Deepak Kumar ^{[2
]}

机构：

[1] SGSITS Indore, E&TC Engn Dept, Indore, Madhya Pradesh, India

[2] SGSITS Indore, E&I Engn Dept, Indore, Madhya Pradesh, India

来源：

2019 IEEE 5TH INTERNATIONAL CONFERENCE FOR CONVERGENCE IN TECHNOLOGY (I2CT) | 2019年

关键词：

VLSI; PLL; DFT; VCO; AMS-SoC; DWT;

D O I：

10.1109/i2ct45611.2019.9033900

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This work reports fault detection techniques for Analog/Mixed signal SoC based applications with the help of wavelet transform. In this paper, phase and frequency faults are analyzed & detected for mixed signal circuits. For the validation of the proposed technique, mixed signal circuit like phase locked loop, voltage controlled oscillator, analog to digital converter are tested for various AMS-SoC applications in various ranges of phase and frequency. If some deviations occur in phase and frequency of the given circuits then fault may detected according to the deviations. Previously fast fourier transform may use for some applications, but it was failed to analyzed non stationary signals whereas wavelet transform allows to analyze component of non-stationary signals. Paper presents performance of fast fourier transform for different frequency and channel power, SNR of VCO is -8.87 dBc, Total harmonic distortion is -19.27dB and discrete wavelet transform response for change in time period is 0.534sec and accordingly change in voltage will be -572. 0.368mv.

引用

页数：4