Application of Tuning Fork Sensors for In-situ Studies of Dynamic Force Interactions Inside Scanning and Transmission Electron Microscopes

被引:1
作者
Andzane, Jana [1 ]
Poplausks, Raimonds [1 ]
Prikulis, Juris [1 ]
Lohmus, Ruenno [2 ]
Vlassov, Sergei [2 ]
Kubatkin, Sergey [3 ]
Erts, Donats [1 ]
机构
[1] Univ Latvia, Inst Chem Phys, LV-1586 Riga, Latvia
[2] Univ Tartu, Inst Phys, EE-51014 Tartu, Estonia
[3] Chalmers, Dept Microtechnol & Nanosci, SE-41296 Gothenburg, Sweden
来源
MATERIALS SCIENCE-MEDZIAGOTYRA | 2012年 / 18卷 / 02期
关键词
friction; nanomechanics; tuning fork; microscopy; NEMS; TUNNELING MICROSCOPE; AMBIENT CONDITIONS; DEVICES; PROBE;
D O I
10.5755/j01.ms.18.2.1927
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Mechanical properties of nanoscale contacts have been probed in-situ by specially developed force sensor based on a quartz tuning fork resonator (TF). Additional control is provided by observation of process in scanning electron microscope (SEM) and transmission electron microscope (TEM). A piezoelectric manipulator allows precise positioning of atomic force microscope (AFM) probe in contact with another electrode and recording of the IF oscillation amplitude and phase while simultaneously visualizing the contact area in electron microscope. Electrostatic control of interaction between the electrodes is demonstrated during observation of the experiment in SEM. In the TEM system the TF sensor operated in shear force mode: Use of TEM allowed for direct control of separation between electrodes. New opportunities for in situ studies of nanomechanical systems using these instruments are discussed.
引用
收藏
页码:197 / 201
页数:5
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