A large range of boron doping with low compensation ratio for homoepitaxial diamond films

被引:71
作者
Lagrange, JP [1 ]
Deneuville, A [1 ]
Gheeraert, E [1 ]
机构
[1] CNRS, Etud Proprietes Elect Solides Lab, F-38042 Grenoble 9, France
关键词
diamond; electronic properties;
D O I
10.1016/S0008-6223(98)00275-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A large range ([B] from 5 x 10(16) to 8 x 10(20) cm(-3)) of boron concentration has been obtained for homoepitaxial diamond films. From the variation of the conductivity versus temperature between 300 and 1000 K, a simpler method is used to derive the activation energy(ies) E-a and the compensation ratio than from the variation of the hole concentration and mobility with temperature. For [B] < 2 x 10(17) cm(-3), a saturation of the conductivity is observed between 680 and 1000 K, E-a = E-i (ionisation energy of the boron), and compensation ratio around 10% is deduced. Then, up to 10(19) cm(-3), an additional E-a = E-i/2 = 185 meV is observed between 500 and 1000 K, with compensation ratio <10%. At higher [B], an additional nearest neighbour hopping contribution to the conduction is obtained from the formation of the boron impurity band. It dominates and gives metallic conductivity when [B] = 3 x 10(20) cm(-3). (C) 1999 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:807 / 810
页数:4
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