Evaluation of characterization techniques for iron pipe corrosion products and iron oxide thin films

被引：16

作者：

Borch, Thomas ^{[1
,2
]}

Camper, Anne K. ^{[3
,4
]}

Biederman, Joel A. ^{[5
]}

Butterfield, Phillip W. ^{[6
]}

Gerlach, Robin ^{[4
,7
]}

Amonette, James E. ^{[8
]}

机构：

[1] Colorado State Univ, Dept Soil & Crop Sci, Ft Collins, CO 80523 USA

[2] Colorado State Univ, Dept Chem, Ft Collins, CO 80523 USA

[3] Montana State Univ, Dept Civil Engn, Bozeman, MT 59717 USA

[4] Montana State Univ, Ctr Biofilm Engn, Bozeman, MT 59717 USA

[5] Suffield Acad, Suffield, CT 06078 USA

[6] Washington State Univ, Dept Civil & Environm Engn, Spokane, WA 99210 USA

[7] Montana State Univ, Dept Chem & Biol Engn, Bozeman, MT 59717 USA

[8] Pacific NW Natl Lab, Richland, WA 99352 USA

来源：

JOURNAL OF ENVIRONMENTAL ENGINEERING | 2008年 / 134卷 / 10期

关键词：

D O I：

10.1061/(ASCE)0733-9372(2008)134:10(835)

中图分类号：

X [环境科学、安全科学];

学科分类号：

08 ; 0830 ;

摘要：

A common problem faced by drinking water studies is that of properly characterizing the corrosion products (CP) in iron pipes or synthetic Fe (hydr)oxides used to simulate the iron pipe used in municipal drinking-water systems. The present work compares the relative applicability of a suite of imaging and analytical techniques for the characterization of CPs and synthetic Fe oxide thin films and provide an overview of the type of data that each instrument can provide as well as their limitations to help researchers and consultants choose the best technique for a given task. Crushed CP from a water distribution system and synthetic Fe oxide thin films formed on glass surfaces were chosen as test samples for this evaluation. The CP and synthetic Fe oxide thin films were analyzed by atomic force microscopy (AFM), scanning electron microscopy (SEM), energy-dispersive spectroscopy, time-of-flight secondary ion mass spectrometry (ToF-SIMS), X-ray powder diffractometry (XRD), grazing incident diffractometry (GID), transmission electron microscopy (TEM), selected area electron diffraction, X-ray photoelectron spectroscopy (XPS), Fourier transform infrared, Mossbauer spectroscopy, Brunauer-Emmett-Teller N-2 adsorption and Fe concentration was determined by the ferrozine method. XRD and GID were found to be the most suitable techniques for identification of the mineralogical composition of CP and synthetic Fe oxide thin films, respectively. AFM and a combined ToF-SIMS-AFM approach proved excellent for roughness and depth profiling analysis of synthetic Fe oxide thin films, respectively. Corrosion products were difficult to study by AFM due to their surface roughness, while synthetic Fe oxide thin films resisted most spectroscopic methods due to their limited thickness (118 nm). XPS analysis is not recommended for mixtures of Fe (hydr)oxides due to their spectral similarities. SEM and TEM provided great detail on mineralogical morphology.

引用

页码：835 / 844

页数：10

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