Defect analysis by statistical fitting to 3D atomic maps

被引：2

作者：

Balogh, Zoltan ^{[1
]}

Oberdorfer, Christian ^{[1
]}

Chellali, Mohammed Reda ^{[1
]}

Stender, Patrick ^{[1
]}

Nowak, Susann ^{[1
]}

Schmitz, Guido ^{[1
]}

机构：

[1] Univ Munster, Inst Mat Phys, D-48149 Munster, Germany

来源：

ULTRAMICROSCOPY | 2013年 / 132卷

关键词：

Atom probe tomography; Composition profiling; Chi-square test; Grain boundaries; Triple junctions; Statistical analysis; TRIPLE JUNCTIONS; PROBE DATA; SEGREGATION; DIFFUSION;

D O I：

10.1016/j.ultramic.2012.12.020

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In this article we present a statistical fitting method for evaluation of atomic reconstructions which does not require a coarse-graining step. The fitting compares different models of chemical structure in their capability to explain the measured data set by a least square type merit function. Only preliminary qualitative assumptions about the possible chemical structure are required, while accurate quantitative parameters of the chosen model are delivered by fitting. The technique is particularly useful for singular defect structures with very high composition gradients, for which iso-concentration surfaces determined by coarse graining become questionable or impossible. We demonstrate that particularly detailed information can be gained from triple junctions and grain boundaries. (C) 2013 Elsevier B.V. All rights reserved,

引用

页码：86 / 91

页数：6

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