The development of Cu bonding wire with oxidation-resistant metal coating

被引:100
作者
Kaimori, S [1 ]
Nonaka, T
Mizoguchi, A
机构
[1] Sumitomo Elect Ind Ltd, Elect Lab, Osaka 5540024, Japan
[2] Sumitomo Elect Ind Ltd, Mat R&D Lab, Osaka 5540024, Japan
[3] Sumitomo Elect Wintec Ltd, Dept Engn, Osaka 5540024, Japan
来源
IEEE TRANSACTIONS ON ADVANCED PACKAGING | 2006年 / 29卷 / 02期
关键词
copper; bondability; bonding wire; electroplating; melting point; oxidation-resistance; palladium; reliability test; wettability;
D O I
10.1109/TADVP.2006.872999
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Although Cu bonding wire excels over An bonding wire in some respects such as production costs, it has not been widely used because of its poor bondability at second bonds due to surface oxidation. We conceived an idea of electroplating oxidation-resistant metal on the Cu bonding wire to prevent the surface oxidation. The electroplating of An, Ag, Pd, and Ni over Cu bonding wire all increased bond strengths as expected, but it caused problematic ball shapes except Pd-plated Cu bonding wire. The wire could produce the same ball shape as that of An bonding wire. It was also proved to have excellent bondability sufficient to replace An bonding wire. That is, it excelled in bond strengths, defective bonding ratio, and wideness of "Parameter Windows." It also showed the same stability as An bonding wire in reliability tests, while bonds of Cu bonding wire were deteriorated in a few of the tests. In short, the Pd-plated Cu bonding wire can realize excellent bonding similar to An bonding wire, while having much lower production costs.
引用
收藏
页码:227 / 231
页数:5
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