Quantification of strain and orientation measurement error in cross-correlation EBSD in hexagonal close-packed materials

被引：7
作者：
Niezgoda, Stephen R. [1 ]
McCabe, Rodney J. [1 ]
Tome, Carlos N. [1 ]
机构：
[1] Los Alamos Natl Lab, Div Mat Sci & Technol, Los Alamos, NM 87545 USA
来源：
SCRIPTA MATERIALIA | 2012年 / 67卷 / 10期
关键词：
Electron backscatter diffraction; EBSD; Deformation; Strain; SEM; ELECTRON BACKSCATTER DIFFRACTION; ELASTIC-STRAIN; SIMULATIONS; MICROSTRUCTURE; ROTATIONS;
D O I：
10.1016/j.scriptamat.2012.07.036
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Cross-correlation electron backscatter diffraction (CC-EBSD) is a novel technique for mapping relative elastic strain variations in the SEM. Recently Britton and Wilkinson have demonstrated that, in deformed materials, lattice rotations can result in non-physical strain values. In this work, we quantify this error for hcp polycrystals and demonstrate that similar artifacts can occur in the presence of large elastic strains. Additionally, open issues limiting the application of CC-EBSD to strain analysis in deformed polycrystals are highlighted. Published by Elsevier Ltd. on behalf of Acta Materialia Inc.
引用
收藏
页码：818 / 821
页数：4
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