graphene;
carrier transport;
ion irradiation;
defect;
helium ion microscope;
transport gap;
strong localization;
FUNCTIONALIZATION;
BANDGAP;
HYDROGENATION;
CHLORINATION;
SPECTROSCOPY;
TRANSITION;
ROUTE;
D O I:
10.1021/nn401992q
中图分类号:
O6 [化学];
学科分类号:
0703 ;
摘要:
The conduction properties of graphene were tuned by tailoring the lattice by using an accelerated helium ion beam to embed low-density defects in the lattice. The density of the embedded defects was estimated to be 2-3 orders of magnitude lower than that of carbon atoms, and they functionalized a graphene sheet in a more stable manner than chemical surface modifications can do. Current modulation through back gate biasing was demonstrated at room temperature with a current on off ratio of 2 orders of magnitude, and the activation energy of the thermally activated transport regime was evaluated. The exponential dependence of the current on the length of the functionalized region in graphene suggested that conduction tuning is possible through strong localization of carriers at sites induced by a sparsely distributed random potential modulation.
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
Bostwick, Aaron
McChesney, Jessica L.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
McChesney, Jessica L.
Emtsev, Konstantin V.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Erlangen Nurnberg, Lehrstuhl Tech Phys, D-91058 Erlangen, GermanyUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
Emtsev, Konstantin V.
Seyller, Thomas
论文数: 0引用数: 0
h-index: 0
机构:
Univ Erlangen Nurnberg, Lehrstuhl Tech Phys, D-91058 Erlangen, GermanyUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
Seyller, Thomas
Horn, Karsten
论文数: 0引用数: 0
h-index: 0
机构:
Max Planck Gesell, Fritz Haber Inst, Dept Mol Phys, D-14195 Berlin, GermanyUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
Horn, Karsten
Kevan, Stephen D.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Oregon, Dept Phys, Eugene, OR 97403 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
Kevan, Stephen D.
Rotenberg, Eli
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
Bostwick, Aaron
McChesney, Jessica L.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
McChesney, Jessica L.
Emtsev, Konstantin V.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Erlangen Nurnberg, Lehrstuhl Tech Phys, D-91058 Erlangen, GermanyUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
Emtsev, Konstantin V.
Seyller, Thomas
论文数: 0引用数: 0
h-index: 0
机构:
Univ Erlangen Nurnberg, Lehrstuhl Tech Phys, D-91058 Erlangen, GermanyUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
Seyller, Thomas
Horn, Karsten
论文数: 0引用数: 0
h-index: 0
机构:
Max Planck Gesell, Fritz Haber Inst, Dept Mol Phys, D-14195 Berlin, GermanyUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
Horn, Karsten
Kevan, Stephen D.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Oregon, Dept Phys, Eugene, OR 97403 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
Kevan, Stephen D.
Rotenberg, Eli
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA