The Research on Fault Model in Nonlinear Analog and Mixed-Signal Circuits

被引:0
|
作者
Xu Qingyao [1 ]
Cui Shaohui [1 ]
Xu Changbin
Han Lujie [1 ]
机构
[1] Ordnance Engn Coll, Dept Ground Air Missile, Shijiazhuang 050003, Peoples R China
关键词
slope fault model; nonlinear analog circuits; piecewise linear function; tolerance;
D O I
10.1016/j.proeng.2012.01.635
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Fault modeling is the key and the difficulty of analog and mixed-signal circuits. The existing fault model include resistance model, perfect switch model, MOS transistor width-length ratio model and slope fault model, these methods have succeed in a certain extent, but also existed much limitation. In this paper, on the basis of research into slope fault model, this paper presents a new fault model is improved slope fault model. The fault model utilizes piecewise linear function to approximate the nonlinear analog circuit, and solve the problem of tolerance by using eulerian length. The experimental result is given to clarify our approach and to show its efficiency. This research provides theoretical foundation for the research of analog and mixed-signal circuits. (c) 2011 Published by Elsevier Ltd. Selection and/or peer-review under responsibility of Harbin University of Science and Technology
引用
收藏
页码:4152 / 4156
页数:5
相关论文
共 50 条
  • [1] Fault macromodeling for analog/mixed-signal circuits
    Pan, CY
    Cheng, KTT
    ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY, 1997, : 913 - 922
  • [2] Verifying nonlinear analog and mixed-signal circuits with inputs
    Fan, Chuchu
    Meng, Yu
    Maier, Juergen
    Bartocci, Ezio
    Mitra, Sayan
    Schmid, Ulrich
    IFAC PAPERSONLINE, 2018, 51 (16): : 241 - 246
  • [3] Fault Simulation for Dynamic Failures in Analog and Mixed-Signal Circuits
    Melis, Tommaso
    JOURNAL OF FAILURE ANALYSIS AND PREVENTION, 2024, 24 (05) : 2080 - 2094
  • [4] Symbolic model checking of Analog/Mixed-Signal circuits
    Walter, David
    Little, Scott
    Seegmiller, Nicholas
    Myers, Chris J.
    Yoneda, Tomohiro
    PROCEEDINGS OF THE ASP-DAC 2007, 2007, : 316 - +
  • [5] Fault modeling and fault sampling for isolating faults in analog and mixed-signal circuits
    Chakrabarti, Sudip
    Chatterjee, Abhijit
    Proceedings - IEEE International Symposium on Circuits and Systems, 1999, 2
  • [6] Fault modeling and fault sampling for isolating faults in analog and mixed-signal circuits
    Chakrabarti, S
    Chatterjee, A
    ISCAS '99: PROCEEDINGS OF THE 1999 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 2: ANALOG AND DIGITAL CIRCUITS, 1999, : 444 - 447
  • [7] Impedance Calculation Methodology for Fault Simulation of Analog and Mixed-signal Circuits
    Brenkus, Juraj
    Stopjakova, Viera
    Arbet, Daniel
    Gyepes, Gabor
    Majer, Libor
    2014 24TH INTERNATIONAL CONFERENCE RADIOELEKTRONIKA (RADIOELEKTRONIKA 2014), 2014,
  • [8] Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model
    Park, Joonsung
    Shin, Hongjoong
    Abraham, Jacob A.
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2011, 27 (03): : 321 - 334
  • [9] Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model
    Joonsung Park
    Hongjoong Shin
    Jacob A. Abraham
    Journal of Electronic Testing, 2011, 27
  • [10] Effects of radiation on analog and mixed-signal circuits
    Lubaszewski, Marcelo
    Balen, Tiago
    Schuler, Erik
    Carro, Luigi
    Huertas, Jose Luis
    RADIATION EFFECTS ON EMBEDDED SYSTEMS, 2007, : 89 - +