600-V 27-mΩ normally off SiC junction field effect transistors for high-efficiency power supply

被引:5
|
作者
Shimizu, Haruka [1 ]
Okino, Hiroyuki [1 ]
Akiyama, Satoru [1 ]
Katoh, Kaoru [2 ]
Yokoyama, Natsuki [1 ]
Ishikawa, Katsumi [2 ]
机构
[1] Hitachi Ltd, Cent Res Lab, Kokubunji, Tokyo 1878601, Japan
[2] Hitachi Ltd, Hitachi Res Lab, Hitachi, Ibaraki 3191292, Japan
关键词
Blocking voltage - Gate-leakage current - High-efficiency - Junction field effect transistors - Junction field-effect transistors (JFETs) - Localized current - Oxynitridation - Server power supplies;
D O I
10.7567/JJAP.53.031303
中图分类号
O59 [应用物理学];
学科分类号
摘要
Normally-off SiC junction field effect transistors (JFETs) with high blocking voltage and low gate leakage current were developed by localized current-path doping (LCD). Numerical simulation of electric field revealed that LCD effectively decreases the on-resistance of SiC JFETs without degrading blocking voltage. On the basis of the obtained simulation results, 600-V 27-m Omega normally off SiC JFETs were fabricated by LDC. The gate leakage current of the fabricated JFETs was suppressed by surface oxynitridation. By applying in a server power supply, we found that these improved JFETs decreased power loss due to FETs by 66%. (C) 2014 The Japan Society of Applied Physics
引用
收藏
页数:5
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