Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy

被引：1
作者：
Müller, AD [1 ]
Müller, F
Hietschold, M
Demming, F
Jersch, J
Dickmann, K
机构：
[1] Univ Chemnitz, Inst Phys, D-09107 Chemnitz, Germany
[2] Laserzentrum FH Munster, D-48565 Steinfurt, Germany
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 10期
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D O I：
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中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Shape and composition of electrochemically etched tungsten tips for use in scanning tunneling microscopy (STM) were investigated in a transmission electron microscope (TEM) with a Gathan imaging filter (GIP). The tips are prepared by a lamella drop-off technique. We observe typical tip radii of less than 10 nm. After a storage of some days under ambient conditions, an amorphous oxide film is detectable. The electron energy-loss spectroscopy confirms that the surface is contaminated by compounds that contain carbon, too. (C) 1999 American Institute of Physics. [S0034- 6748(99)01110-7].
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页码：3970 / 3972
页数：3
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