A combined sinusoidal transmission grating spectrometer and x-ray diode array diagnostics for time-resolved spectral measurements in laser plasma experiments

被引：8

作者：

Shpilman, Ze'ev ^{[1
]}

Hurvitz, Gilad ^{[1
]}

Danon, Liron ^{[1
]}

Shussman, Tomer ^{[1
]}

Ehrlich, Yosi ^{[1
]}

Maman, Shlomo ^{[1
]}

Levy, Izhak ^{[1
]}

Fraenkel, Moshe ^{[1
]}

机构：

[1] Soreq NRC, Plasma Phys Dept, IL-81800 Yavne, Israel

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2019年 / 90卷 / 01期

关键词：

Laser diagnostics - Laser produced plasmas - X ray spectrometers - Plasma interactions - X ray diffraction;

D O I：

10.1063/1.5051486

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new system which combines two independent diagnostic devices on the same line of sight is used to measure the X-ray spectrum in the 50-1000 eV regime. The first device is an array of six channels of time-resolved X-ray diodes (XRD's), arranged to cover the spectral band with low spectral resolution (lambda/Delta lambda similar to 3). The second device is a time-integrated sinusoidal transmission grating spectrometer (STGS) with a wide spectral range coverage and moderate spectral resolution (lambda/Delta lambda similar to 30). The spectral band of each XRD can be tuned by selecting a cathode, an x-ray mirror, and a filter. The novel sinusoidal shape of the STGS allows acquisition of a pure first-order spectrum without contribution of high dispersion orders, resulting in a higher accuracy spectrum measurement. The system described here has recently been used [Y. Ehrlich et al., Rev. Sci. Instrum. 88, 043507 (2017)] to demonstrate an improved unfolding algorithm of an XRD-acquired spectrum, achieved by experimental information gathered from the STGS measurement. Published under license by AIP Publishing.

引用

页数：9

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